The Basics Of Crystallography And Diffraction
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| Author | : Christopher Hammond |
| Publisher | : OUP Oxford |
| Total Pages | : 450 |
| Release | : 2009-05-07 |
| Genre | : Science |
| ISBN | : 019156771X |
This book provides a clear introduction to topics which are essential to students in a wide range of scientific disciplines but which are otherwise only covered in specialised and mathematically detailed texts. It shows how crystal structures may be built up from simple ideas of atomic packing and co-ordination, it develops the concepts of crystal symmetry, point and space groups by way of two dimensional examples of patterns and tilings, it explains the concept of the reciprocal lattice in simple terms and shows its importance in an understanding of light, X-ray and electron diffraction. Practical examples of the applications of these techniques are described and also the importance of diffraction in the performance of optical instruments. The book is also of value to the general reader since it shows, by biographical and historical references, how the subject has developed and thereby indicates some of the excitement of scientific discovery.
| Author | : Christopher Hammond |
| Publisher | : Oxford University Press, USA |
| Total Pages | : 352 |
| Release | : 2001 |
| Genre | : Crystallography |
| ISBN | : 9780198505525 |
The present book provides a clear and comprehensive introduction to the topics of crystallography and diffraction for undergraduate and beginning graduate students and lecturers in physics, chemistry, materials and earth sciences, but will also be of interest to the layperson who wishes toknow about these topics beyond the level given in more general trade science books. The book shows how crystal structures may be built up from simple ideas of atomic packing and co-ordination, and develops the concepts of crystal symmetry, point and space groups by way of two-dimensional examples ofpatterns and tilings. Furthermore, the concept of the reciprocal lattice is explained in simple terms and its importance in an understanding of light, x-ray and electron diffraction shown. Finally, the book covers practical examples of the applications of these techniques, and describes theimportance of diffraction in the performance of optical instruments. For this second edition, the existing material has been thoroughly updated, additional figures and exercises have been supplied and two new chapters added. From reviews on the 1/e: '... This is a timely, well-constructed bookwhich should be seriously considered by every teacher of crystallography and can be recommended to anyone who wants to get to grips with crystallography and diffraction.' P. Goodhew, Journal of Microscopy, June 1998 'IUCr publications have always been outstanding for quality of presentation andexposition and this book maintains that high standard.' J.E. Chisholm, Mineralogical Magazine, February 1998
| Author | : Marc De Graef |
| Publisher | : Cambridge University Press |
| Total Pages | : 773 |
| Release | : 2012-10-08 |
| Genre | : Technology & Engineering |
| ISBN | : 1139560476 |
This highly readable, popular textbook for upper undergraduates and graduates comprehensively covers the fundamentals of crystallography and symmetry, applying these concepts to a large range of materials. New to this edition are more streamlined coverage of crystallography, additional coverage of magnetic point group symmetry and updated material on extraterrestrial minerals and rocks. New exercises at the end of chapters, plus over 500 additional exercises available online, allow students to check their understanding of key concepts and put into practice what they have learnt. Over 400 illustrations within the text help students visualise crystal structures and more abstract mathematical objects, supporting more difficult topics like point group symmetries. Historical and biographical sections add colour and interest by giving an insight into those who have contributed significantly to the field. Supplementary online material includes password-protected solutions, over 100 crystal structure data files, and Powerpoints of figures from the book.
| Author | : Yoshio Waseda |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 320 |
| Release | : 2011-03-18 |
| Genre | : Technology & Engineering |
| ISBN | : 3642166350 |
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
| Author | : Xiaodong Zou |
| Publisher | : Oxford University Press |
| Total Pages | : 345 |
| Release | : 2011-08-18 |
| Genre | : Science |
| ISBN | : 0199580200 |
In the modern world of ever smaller devices and nanotechnology, electron crystallography emerges as the most important method capable of determining the structure of minute objects down to the size of individual atoms. Crystals of only a few millionths of a millimetre are studied. This is the first textbook explaining how this is done. Great attention is given to symmetry in crystals and how it manifests itself in electron microscopy and electron diffraction, and how this symmetry can be determined and taken advantage of in achieving improved electron microscopy images and solving crystal structures from electron diffraction patterns. Theory and practice are combined; experimental images, diffraction patterns, formulae and numerical data are discussed in parallel, giving the reader a complete understanding of what goes on inside the "black boxes" of computer programs. This up-to-date textbook contains the newest techniques in electron crystallography, including detailed descriptions and explanations of the recent remarkable successes in determining the very complex structures of zeolites and intermetallics. The controversial issue of whether there is phase information present in electron micrsocopy images or not is also resolved once and for all. The extensive appendices include computer labs which have been used at various courses at Stockholm University and international schools in electron crystallography, with applications to the textbook. Students can download image processing programs and follow these lab instructions to get a hands-on experience of electron crystallography.
| Author | : Donald E. Sands |
| Publisher | : Courier Corporation |
| Total Pages | : 196 |
| Release | : 2012-06-14 |
| Genre | : Science |
| ISBN | : 0486136809 |
Clear, concise explanation of logical development of basic crystallographic concepts. Topics include crystals and lattices, symmetry, x-ray diffraction, and more. Problems, with answers. 114 illustrations. 1969 edition.
| Author | : Vitalij Pecharsky |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 751 |
| Release | : 2008-11-24 |
| Genre | : Science |
| ISBN | : 0387095799 |
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
| Author | : Myeongkyu Lee |
| Publisher | : CRC Press |
| Total Pages | : 302 |
| Release | : 2017-03-16 |
| Genre | : Science |
| ISBN | : 1315361973 |
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
| Author | : L. J. Clarke |
| Publisher | : John Wiley & Sons |
| Total Pages | : 450 |
| Release | : 1985 |
| Genre | : Science |
| ISBN | : |
Low Energy Electron Diffraction (LEED) is one of the most commonly used techniques for crystal surface characterization at the atomic level. This book is designed to provide all the essential background information necessary to carry out surface crystallography using LEED.
| Author | : B. E. Warren |
| Publisher | : Courier Corporation |
| Total Pages | : 402 |
| Release | : 2012-05-23 |
| Genre | : Science |
| ISBN | : 0486141616 |
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
