The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination
Author | : John Denman |
Publisher | : |
Total Pages | : 488 |
Release | : 2007 |
Genre | : Forensic sciences |
ISBN | : |
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Author | : John Denman |
Publisher | : |
Total Pages | : 488 |
Release | : 2007 |
Genre | : Forensic sciences |
ISBN | : |
Author | : Alan M. Spool |
Publisher | : Momentum Press |
Total Pages | : 267 |
Release | : 2016-03-24 |
Genre | : Technology & Engineering |
ISBN | : 1606507745 |
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Author | : Sarah Fearn |
Publisher | : Morgan & Claypool Publishers |
Total Pages | : 67 |
Release | : 2015-10-16 |
Genre | : Technology & Engineering |
ISBN | : 1681740885 |
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Author | : Archana Singh |
Publisher | : Archana Singh |
Total Pages | : 21 |
Release | : 2022-02-22 |
Genre | : Law |
ISBN | : |
Learning should never stop, and with each other's cooperation, we can share knowledge to anyone and everyone. That is why Forensicfield.blog is releasing a series of magazines on forensic science, the first of which is available. This is free of charge. This magazine offers articles authored by a variety of expert individuals, as well as quizzes and games.
Author | : Fred Stevie |
Publisher | : Momentum Press |
Total Pages | : 233 |
Release | : 2015-09-15 |
Genre | : Technology & Engineering |
ISBN | : 1606505890 |
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Author | : J. C. Vickerman |
Publisher | : IM Publications |
Total Pages | : 742 |
Release | : 2013 |
Genre | : Mass spectrometry |
ISBN | : 1906715173 |
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Author | : Jacek Grams |
Publisher | : Nova Publishers |
Total Pages | : 292 |
Release | : 2007 |
Genre | : Science |
ISBN | : 9781600216350 |
This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
Author | : James A. Ohlhausen |
Publisher | : |
Total Pages | : 216 |
Release | : 2004 |
Genre | : Secondary ion mass spectrometry |
ISBN | : |
Author | : Joanna Lee |
Publisher | : |
Total Pages | : |
Release | : 2011 |
Genre | : |
ISBN | : |
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000 +; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. This thesis describes research undertaken to address the above challenges. Sample topography and field effects were evaluated experimentally using model conducting and insulating fibres and compared with computer simulations to provide recommendation to diagnose and reduce the effects. Two popular multivariate methods, principal component analysis (PCA) and multivariate curve resolution (MCR), were explored using mixed organic systems consisting of a simple polymer blend and complex hair fibres treated with a multi-component formulation to evaluate different multivariate and data preprocessing methods for the optimal identification, localisation and quantification of the chemical components. Finally, cluster ion beams C60 n+ and ArSOO-2S00 + were evaluated on an inorganic surface and an organic delta layer reference material respectively to elucidate the fundamental metrology of cluster ion sputtering and pave the way for their use in organic depth profiling. These studies provide the essential metrological foundation to address frontier issues in surface and nanoanalysis and extend the measurement capabilities ofToF-SIMS.