An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
Total Pages: 67
Release: 2015-10-16
Genre: Technology & Engineering
ISBN: 1681740885

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Emerging Technologies for the Analysis of Forensic Traces

Emerging Technologies for the Analysis of Forensic Traces
Author: Simona Francese
Publisher: Springer Nature
Total Pages: 275
Release: 2019-09-30
Genre: Science
ISBN: 3030205428

This book provides a line of communication between academia and end users/practitioners to advance forensic science and boost its contribution to criminal investigations and court cases. By covering the state of the art of promising technologies for the analysis of trace evidence using a controlled vocabulary, this book targets the forensics community as well as, crucially, informing the end users on novel and potential forensic opportunities for the fight against crime. By reporting end users commentaries at the end of each chapter, the relevant academic community is provided with clear indications on where to direct further technological developments in order to meet the law requirements for operational deployment, as well as the specific needs of the end users. Promising chemistry based technologies and analytical techniques as well as techniques that have already shown to various degrees an operational character are covered. The majority of the techniques covered have imaging capabilities, that is the ability to visualize the distribution of the target molecules within the trace evidence recovered. This feature enhances intelligibility of the information making it also accessible to a lay audience such as that typically found with a court jury. Trace evidence discussed in this book include fingermarks, bodily fluids, hair, gunshot residues, soil, ink and questioned documents thus covering a wide range of possible evidence recovered at crime scenes.

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry
Author: Fred Stevie
Publisher: Momentum Press
Total Pages: 233
Release: 2015-09-15
Genre: Technology & Engineering
ISBN: 1606505890

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

ToF-SIMS

ToF-SIMS
Author: John C. Vickerman
Publisher:
Total Pages: 820
Release: 2001
Genre: Mass spectrometry
ISBN:

Time-of-flight secondary ion mass spectroemtry is the most versatile of surface analysis techniques that has been developed. Following an overview, this work includes sections devoted to: instrumentation and sample handling; fundamentals and molecular dynamics simulations; optimisation methods; and data interpretation, and analytical applications.

Time-of-Flight Mass Spectrometry and its Applications

Time-of-Flight Mass Spectrometry and its Applications
Author: E.W. Schlag
Publisher: Newnes
Total Pages: 424
Release: 2012-12-02
Genre: Science
ISBN: 0444596186

The resurgence of time-of-flight mass spectrometry (TOF-MS) has had its origin in the simplicity of construction and application of such instruments together with the high transmission and the great increase in resolution that has been achieved. The instrument lends itself naturally to a coupling with pulsed laser sources, though this is not a prerequisite. It also affords a time resolution far beyond that traditionally achieved with mass spectrometric rapid scan techniques - a recent example being the real-time analysis of a multi-component mixture from an automobile exhaust. Furthermore, the mass range appears to be extremely large: mass up to 500 kDa and beyond what is being readily measured in the laboratory today. The present set of contributions attempts to give a survey of current applications from many of the active groups in the field. A variety of new applications are considered which are no doubt just the beginning of large new areas of application. By presenting this work in book form it is hoped that it will be of help to the many groups intending to initiate work in this rapidly expanding new area of mass spectrometry.