Test System Design
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| Author | : Zainalabedin Navabi |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 452 |
| Release | : 2010-12-10 |
| Genre | : Technology & Engineering |
| ISBN | : 1441975489 |
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
| Author | : John K. Ousterhout |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 2021 |
| Genre | : Computer programs |
| ISBN | : 9781732102217 |
"This book addresses the topic of software design: how to decompose complex software systems into modules (such as classes and methods) that can be implemented relatively independently. The book first introduces the fundamental problem in software design, which is managing complexity. It then discusses philosophical issues about how to approach the software design process and it presents a collection of design principles to apply during software design. The book also introduces a set of red flags that identify design problems. You can apply the ideas in this book to minimize the complexity of large software systems, so that you can write software more quickly and cheaply."--Amazon.
| Author | : Erik Larsson |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 397 |
| Release | : 2006-03-30 |
| Genre | : Technology & Engineering |
| ISBN | : 0387256245 |
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
| Author | : Laung-Terng Wang |
| Publisher | : Morgan Kaufmann |
| Total Pages | : 893 |
| Release | : 2010-07-28 |
| Genre | : Technology & Engineering |
| ISBN | : 0080556809 |
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
| Author | : Christine Tursky |
| Publisher | : Prentice Hall |
| Total Pages | : 344 |
| Release | : 2001 |
| Genre | : Computers |
| ISBN | : |
Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.
| Author | : Steve Freeman |
| Publisher | : Pearson Education |
| Total Pages | : 762 |
| Release | : 2009-10-12 |
| Genre | : Computers |
| ISBN | : 0321699769 |
Test-Driven Development (TDD) is now an established technique for delivering better software faster. TDD is based on a simple idea: Write tests for your code before you write the code itself. However, this "simple" idea takes skill and judgment to do well. Now there's a practical guide to TDD that takes you beyond the basic concepts. Drawing on a decade of experience building real-world systems, two TDD pioneers show how to let tests guide your development and “grow” software that is coherent, reliable, and maintainable. Steve Freeman and Nat Pryce describe the processes they use, the design principles they strive to achieve, and some of the tools that help them get the job done. Through an extended worked example, you’ll learn how TDD works at multiple levels, using tests to drive the features and the object-oriented structure of the code, and using Mock Objects to discover and then describe relationships between objects. Along the way, the book systematically addresses challenges that development teams encounter with TDD—from integrating TDD into your processes to testing your most difficult features. Coverage includes Implementing TDD effectively: getting started, and maintaining your momentum throughout the project Creating cleaner, more expressive, more sustainable code Using tests to stay relentlessly focused on sustaining quality Understanding how TDD, Mock Objects, and Object-Oriented Design come together in the context of a real software development project Using Mock Objects to guide object-oriented designs Succeeding where TDD is difficult: managing complex test data, and testing persistence and concurrency
| Author | : Michael T. Nygard |
| Publisher | : Pragmatic Bookshelf |
| Total Pages | : 490 |
| Release | : 2018-01-08 |
| Genre | : Computers |
| ISBN | : 1680504525 |
A single dramatic software failure can cost a company millions of dollars - but can be avoided with simple changes to design and architecture. This new edition of the best-selling industry standard shows you how to create systems that run longer, with fewer failures, and recover better when bad things happen. New coverage includes DevOps, microservices, and cloud-native architecture. Stability antipatterns have grown to include systemic problems in large-scale systems. This is a must-have pragmatic guide to engineering for production systems. If you're a software developer, and you don't want to get alerts every night for the rest of your life, help is here. With a combination of case studies about huge losses - lost revenue, lost reputation, lost time, lost opportunity - and practical, down-to-earth advice that was all gained through painful experience, this book helps you avoid the pitfalls that cost companies millions of dollars in downtime and reputation. Eighty percent of project life-cycle cost is in production, yet few books address this topic. This updated edition deals with the production of today's systems - larger, more complex, and heavily virtualized - and includes information on chaos engineering, the discipline of applying randomness and deliberate stress to reveal systematic problems. Build systems that survive the real world, avoid downtime, implement zero-downtime upgrades and continuous delivery, and make cloud-native applications resilient. Examine ways to architect, design, and build software - particularly distributed systems - that stands up to the typhoon winds of a flash mob, a Slashdotting, or a link on Reddit. Take a hard look at software that failed the test and find ways to make sure your software survives. To skip the pain and get the experience...get this book.
| Author | : |
| Publisher | : |
| Total Pages | : 132 |
| Release | : 1979 |
| Genre | : Ocean thermal power plants |
| ISBN | : |
| Author | : SLPSoft |
| Publisher | : SLPSoft |
| Total Pages | : 374 |
| Release | : |
| Genre | : Computers |
| ISBN | : |
The Software System Design and Modeling enables us to view software in terms of a system. When designing a system, we start with the system requirement and then translate the system requirement to a real product. By using the concept presented in this book, we can design and model a system from the system requirement and then produce the UML model of the system before starting coding. Some key topics discussed in this book include multiple views of a system, requirement interpretation, requirement application, requirement duplication, system function and problem solved by system, agile and scrum methodology, fixed system requirement and non-fixed requirement, incremental software development process, and more. Using the tools from the book, you can develop a system with a full lifecycle. As time goes on, the tools from the book make it possible to update parts of the system that need to be updated without any frustration rather than reinventing the wheel.
| Author | : David Nicholls |
| Publisher | : RIAC |
| Total Pages | : 462 |
| Release | : 2011-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1933904356 |
Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.
