Synthesis And Analysis Of Delay Fault Testable Digital Circuits
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Author | : Parag K. Lala |
Publisher | : Academic Press |
Total Pages | : 222 |
Release | : 1997 |
Genre | : Computers |
ISBN | : 9780124343306 |
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author | : Andreas Kuehlmann |
Publisher | : Springer Science & Business Media |
Total Pages | : 699 |
Release | : 2012-12-06 |
Genre | : Computers |
ISBN | : 1461502926 |
In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to the broad field of design automation during that time. The foundation of ICCAD in 1982 coincided with the growth of Large Scale Integration. The sharply increased functionality of board-level circuits led to a major demand for more powerful Electronic Design Automation (EDA) tools. At the same time, LSI grew quickly and advanced circuit integration became widely avail able. This, in turn, required new tools, using sophisticated modeling, analysis and optimization algorithms in order to manage the evermore complex design processes. Not surprisingly, during the same period, a number of start-up com panies began to commercialize EDA solutions, complementing various existing in-house efforts. The overall increased interest in Design Automation (DA) re quired a new forum for the emerging community of EDA professionals; one which would be focused on the publication of high-quality research results and provide a structure for the exchange of ideas on a broad scale. Many of the original ICCAD volunteers were also members of CANDE (Computer-Aided Network Design), a workshop of the IEEE Circuits and Sys tem Society. In fact, it was at a CANDE workshop that Bill McCalla suggested the creation of a conference for the EDA professional. (Bill later developed the name).
Author | : N. K. Jha |
Publisher | : Cambridge University Press |
Total Pages | : 1022 |
Release | : 2003-05-08 |
Genre | : Computers |
ISBN | : 9781139437431 |
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author | : Rene David |
Publisher | : CRC Press |
Total Pages | : 496 |
Release | : 2020-11-25 |
Genre | : Technology & Engineering |
ISBN | : 1000110168 |
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author | : |
Publisher | : |
Total Pages | : 704 |
Release | : 1998 |
Genre | : Automatic test equipment |
ISBN | : |
Author | : Petra Michel |
Publisher | : Springer Science & Business Media |
Total Pages | : 424 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461536324 |
Over the past decade there has been a dramatic change in the role played by design automation for electronic systems. Ten years ago, integrated circuit (IC) designers were content to use the computer for circuit, logic, and limited amounts of high-level simulation, as well as for capturing the digitized mask layouts used for IC manufacture. The tools were only aids to design-the designer could always find a way to implement the chip or board manually if the tools failed or if they did not give acceptable results. Today, however, design technology plays an indispensable role in the design ofelectronic systems and is critical to achieving time-to-market, cost, and performance targets. In less than ten years, designers have come to rely on automatic or semi automatic CAD systems for the physical design ofcomplex ICs containing over a million transistors. In the past three years, practical logic synthesis systems that take into account both cost and performance have become a commercial reality and many designers have already relinquished control ofthe logic netlist level of design to automatic computer aids. To date, only in certain well-defined areas, especially digital signal process ing and telecommunications. have higher-level design methods and tools found significant success. However, the forces of time-to-market and growing system complexity will demand the broad-based adoption of high-level, automated methods and tools over the next few years.
Author | : Patrick DeWilde |
Publisher | : Springer Science & Business Media |
Total Pages | : 426 |
Release | : 2012-12-06 |
Genre | : Computers |
ISBN | : 1461535069 |
Computer Systems and Software Engineering is a compilation of sixteen state-of-the-art lectures and keynote speeches given at the COMPEURO '92 conference. The contributions are from leading researchers, each of whom gives a new insight into subjects ranging from hardware design through parallelism to computer applications. The pragmatic flavour of the contributions makes the book a valuable asset for both researchers and designers alike. The book covers the following subjects: Hardware Design: memory technology, logic design, algorithms and architecture; Parallel Processing: programming, cellular neural networks and load balancing; Software Engineering: machine learning, logic programming and program correctness; Visualization: the graphical computer interface.
Author | : S. Chakravarty |
Publisher | : Springer Science & Business Media |
Total Pages | : 336 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 146156137X |
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Author | : Yoshio Nishi |
Publisher | : CRC Press |
Total Pages | : 1186 |
Release | : 2000-08-09 |
Genre | : Technology & Engineering |
ISBN | : 9780824787837 |
The Handbook of Semiconductor Manufacturing Technology describes the individual processes and manufacturing control, support, and infrastructure technologies of silicon-based integrated-circuit manufacturing, many of which are also applicable for building devices on other semiconductor substrates. Discussing ion implantation, rapid thermal processing, photomask fabrication, chip testing, and plasma etching, the editors explore current and anticipated equipment, devices, materials, and practices of silicon-based manufacturing. The book includes a foreword by Jack S. Kilby, cowinner of the Nobel Prize in Physics 2000 "for his part in the invention of the integrated circuit."
Author | : John B. Gosling |
Publisher | : Cambridge University Press |
Total Pages | : 302 |
Release | : 1993-10-29 |
Genre | : Computers |
ISBN | : 9780521426725 |
This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.