Surface Effects Of Radiation On Microelectronic Devices Part Ii
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Catalog of National Bureau of Standards Publications, 1966-1976
Author | : United States. National Bureau of Standards. Technical Information and Publications Division |
Publisher | : |
Total Pages | : 844 |
Release | : 1978 |
Genre | : Government publications |
ISBN | : |
Materials and Processes for the 70's
Author | : Society of Aerospace Material and Process Engineers |
Publisher | : |
Total Pages | : 1214 |
Release | : 1969 |
Genre | : Airplanes |
ISBN | : |
Space Microelectronics Volume 2: Integrated Circuit Design for Space Applications
Author | : Anatoly Belous |
Publisher | : Artech House |
Total Pages | : 629 |
Release | : 2017-07-31 |
Genre | : Technology & Engineering |
ISBN | : 1630814695 |
This invaluable second volume of a two-volume set is filled with details about the integrated circuit design for space applications. Various considerations for the selection and application of electronic components for designing spacecraft are discussed. The basic constructions of submicron transistors and schottky diodes during the technological process of production are explored. This book provides details on the energy consumption minimization methods for microelectronic devices. Specific topics include: Features and physical mechanisms of the effect of space radiation on all the main classes of microcircuits, including peculiarities of radiation impact on submicron integrated circuits;Special design, technology, and schematic methods of increasing the resistance to various types of space radiation;Recommendations for choosing research equipment and methods for irradiating various samples;Microcircuit designers on the composition of test elements for the study of the effect of radiation;Microprocessors, circuit boards, logic microcircuits, digital, analog, digital–analog microcircuits manufactured in various technologies (bipolar, CMOS, BiCMOS, SOI);Problems involved with designing high speed microelectronic devices and systems based on SOS-and SOI-structures;System-on-chip and system-in-package and methods for rejection of silicon microcircuits with hidden defects during mass production.
Catalog of National Bureau of Standards Publications, 1966-1976
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 844 |
Release | : 1978 |
Genre | : Government publications |
ISBN | : |
Testing at the Speed of Light
Author | : National Academies of Sciences, Engineering, and Medicine |
Publisher | : National Academies Press |
Total Pages | : 89 |
Release | : 2018-06-08 |
Genre | : Science |
ISBN | : 030947082X |
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Government Reports Annual Index
Author | : |
Publisher | : |
Total Pages | : 1166 |
Release | : 1983 |
Genre | : Government reports announcements & index |
ISBN | : |