Study Of Transient Radiation Effects On Microelectronics
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Author | : National Academies of Sciences, Engineering, and Medicine |
Publisher | : National Academies Press |
Total Pages | : 89 |
Release | : 2018-06-08 |
Genre | : Science |
ISBN | : 030947082X |
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Author | : |
Publisher | : |
Total Pages | : 912 |
Release | : |
Genre | : Science |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 1388 |
Release | : 1967 |
Genre | : Aeronautics |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 1028 |
Release | : 1966 |
Genre | : Government publications |
ISBN | : |
Author | : Raoul Velazco |
Publisher | : Springer Science & Business Media |
Total Pages | : 273 |
Release | : 2007-06-19 |
Genre | : Technology & Engineering |
ISBN | : 140205646X |
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Author | : |
Publisher | : |
Total Pages | : 1298 |
Release | : 1974 |
Genre | : Nuclear energy |
ISBN | : |
Author | : Allan H Johnston |
Publisher | : World Scientific |
Total Pages | : 376 |
Release | : 2010-04-27 |
Genre | : Technology & Engineering |
ISBN | : 9814467650 |
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Author | : |
Publisher | : |
Total Pages | : 412 |
Release | : 1978 |
Genre | : Integrated circuits |
ISBN | : |
Author | : Paul Leroux |
Publisher | : MDPI |
Total Pages | : 210 |
Release | : 2019-08-26 |
Genre | : Technology & Engineering |
ISBN | : 3039212796 |
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Author | : Battelle Memorial Institute. Radiation Effects Information Center |
Publisher | : |
Total Pages | : 122 |
Release | : 1966 |
Genre | : |
ISBN | : |