State Of The Art Program On Compound Semiconductors Xxxviii And Wide Bandgap Semiconductors For Photonic And Electronic Devices And Sensors Iii
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Author | : Edward B. Stokes |
Publisher | : The Electrochemical Society |
Total Pages | : 292 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 9781566773492 |
Author | : C. O'Dwyer |
Publisher | : The Electrochemical Society |
Total Pages | : 236 |
Release | : 2011-04 |
Genre | : Science |
ISBN | : 1566778697 |
The symposium consisted of four half-day sessions on topics at the forefront of semiconductor electrochemistry and solution-based processing including etching, patterning, passivation, porosity formation, electrochemical film growth, energy conversion materials, deposition, semiconductor surface functionalization, photoelectrochemical and optical properties, and other related processes. This issue of ECS Transactions contains 18 of the papers presented including invited papers by H. Föll (Christian-Albrechts University Kiel), J. N. Chazalviel (Ecole Polytechnique, CNRS), D. N. Buckley (University of Limerick, and Past President, ECS), J. D. Holmes (University College Cork), E. Chassaing (IRDEP, EDF-CNRS-ENSCP).
Author | : Electrochemical Society. Electronics Division |
Publisher | : The Electrochemical Society |
Total Pages | : 380 |
Release | : 2002 |
Genre | : Technology & Engineering |
ISBN | : 9781566773690 |
Author | : |
Publisher | : |
Total Pages | : 784 |
Release | : 2003 |
Genre | : American literature |
ISBN | : |
Author | : British Library. Document Supply Centre |
Publisher | : |
Total Pages | : 870 |
Release | : 2003 |
Genre | : Conference proceedings |
ISBN | : |
Author | : Charles Cohn |
Publisher | : McGraw Hill Professional |
Total Pages | : 394 |
Release | : 2005 |
Genre | : Technology & Engineering |
ISBN | : 9780071434843 |
The shrinking of integrated circuits (ICs) puts tremendous stress on overall device reliability. This unique treatment uses graphic illustration to clearly identify all major failure mode types, so engineers can spot failures before they occur.
Author | : |
Publisher | : |
Total Pages | : 1080 |
Release | : 2005 |
Genre | : Books |
ISBN | : |
Every 3rd issue is a quarterly cumulation.
Author | : |
Publisher | : |
Total Pages | : 1020 |
Release | : 2009 |
Genre | : Electrochemistry |
ISBN | : |
Author | : Michael Shur |
Publisher | : World Scientific |
Total Pages | : 143 |
Release | : 2007 |
Genre | : Science |
ISBN | : 9812703837 |
Silicon carbide is known to have been investigated since 1907 when Captain H J Round demonstrated yellow and blue emission by applying bias between a metal needle and an SiC crystal. The potential of using SiC in semiconductor electronics was already recognized half a century ago. Despite its well-known properties, it has taken a few decades to overcome the exceptional technological difficulties of getting silicon carbide material to reach device quality and travel the road from basic research to commercialization.This second of two volumes reviews four important additional areas: the growth of SiC substrates; the deep defects in different SiC polytypes, which after many years of research still define the properties of bulk SiC and the performance and reliability of SiC devices; recent work on SiC JFETs; and the complex and controversial issues important for bipolar devices.Recognized leaders in the field, the contributors to this volume provide up-to-date reviews of further state-of-the-art areas in SiC technology and materials and device research.
Author | : R. F. Kopf |
Publisher | : The Electrochemical Society |
Total Pages | : 422 |
Release | : 2003 |
Genre | : Technology & Engineering |
ISBN | : 9781566773911 |