Soft Errors In Modern Electronic Systems
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| Author | : Michael Nicolaidis |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 331 |
| Release | : 2010-09-24 |
| Genre | : Technology & Engineering |
| ISBN | : 1441969934 |
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
| Author | : Jean-Luc Autran |
| Publisher | : CRC Press |
| Total Pages | : 532 |
| Release | : 2017-12-19 |
| Genre | : Technology & Engineering |
| ISBN | : 1351831550 |
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
| Author | : Dan M. Fleetwood |
| Publisher | : World Scientific |
| Total Pages | : 354 |
| Release | : 2004 |
| Genre | : Technology & Engineering |
| ISBN | : 9789812794703 |
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
| Author | : Behnam Ghavami |
| Publisher | : Springer Nature |
| Total Pages | : 114 |
| Release | : 2020-10-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3030516105 |
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
| Author | : Jean-Luc Autran |
| Publisher | : CRC Press |
| Total Pages | : 432 |
| Release | : 2017-12-19 |
| Genre | : Technology & Engineering |
| ISBN | : 146659084X |
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
| Author | : Paul Leroux |
| Publisher | : MDPI |
| Total Pages | : 210 |
| Release | : 2019-08-26 |
| Genre | : Technology & Engineering |
| ISBN | : 3039212796 |
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
| Author | : Fernanda Kastensmidt |
| Publisher | : Springer |
| Total Pages | : 319 |
| Release | : 2015-12-07 |
| Genre | : Technology & Engineering |
| ISBN | : 3319143522 |
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.
| Author | : Dr. Prakash s, dr. Silvia liberataullo, dr. Yogesh g s, dr. I manimozhi, prof. Shilpa patil. |
| Publisher | : Archers & Elevators Publishing House |
| Total Pages | : |
| Release | : |
| Genre | : Antiques & Collectibles |
| ISBN | : 8194773830 |
| Author | : Alfredo Benso |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 242 |
| Release | : 2005-12-15 |
| Genre | : Technology & Engineering |
| ISBN | : 030648711X |
This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.
| Author | : James M Bower |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 294 |
| Release | : 2013-07-11 |
| Genre | : Medical |
| ISBN | : 1461414245 |
When funding agencies and policy organizations consider the role of modeling and simulation in modern biology, the question is often posed, what has been accomplished ? This book will be organized around a symposium on the 20 year history of the CNS meetings, to be held as part of CNS 2010 in San Antonio Texas in July 2010. The book, like the symposium is intended to summarize progress made in Computational Neuroscience over the last 20 years while also considering current challenges in the field. As described in the table of contents, the chapter’s authors have been selected to provide wide coverage of the applications of computational techniques to a broad range of questions and model systems in neuroscience. The proposed book will include several features that establish the history of the field. For each article, its author will select an article originally appearing in a CNS conference proceedings from 15 – 20 years ago. These short (less than 6 page) articles will provide illustrations of the state of the field 20 years ago. The new articles will describe what has been learned about the subject in the following 20 years, and pose specific challenges for the next 20 years. The second historical mechanism will be the reproduction of the first 12 years of posters from the CNS meeting. These posters in and of themselves have become famous in the field (they hang in the halls of the NIH in Bethesda Maryland) and were constructed as allegories for the state and development of computational neuroscience. The posters were designed by the book’s editor, who will, for the first time, provide a written description of each poster.
