Scanning Electron Microscopy Computer Control And Image Processing
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Springer Handbook of Microscopy
Author | : Peter W. Hawkes |
Publisher | : Springer Nature |
Total Pages | : 1561 |
Release | : 2019-11-02 |
Genre | : Technology & Engineering |
ISBN | : 3030000699 |
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Scanning Microscopy for Nanotechnology
Author | : Weilie Zhou |
Publisher | : Springer Science & Business Media |
Total Pages | : 533 |
Release | : 2007-03-09 |
Genre | : Technology & Engineering |
ISBN | : 0387396209 |
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Scanning Electron Microscopy and X-Ray Microanalysis
Author | : Joseph Goldstein |
Publisher | : Springer Science & Business Media |
Total Pages | : 679 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 1461332737 |
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Author | : David H. Krinsley |
Publisher | : Cambridge University Press |
Total Pages | : 204 |
Release | : 2005-09-15 |
Genre | : Science |
ISBN | : 9780521019743 |
Backscattered scanning electron microscopy (BSE) reveals the minerals, textures, and fabrics of sediments and rocks in much greater detail than is possible with conventional optical microscopy. Backscattered Scanning Electron Microscopy provides a concise summary of the BSE technique. This comprehensive guide uses abundant images to illustrate the type of information BSE yields and the application of the technique to the study of sediments and sedimentary rocks. The authors review the use of this petrographic technique on all the major sedimentary rock types, including sediment grains, sandstones, shales, carbonate rocks, rock varnish, and glauconite. They also describe image analysis techniques that allow quantification of backscattered scanning electron microscope images. Heavily illustrated and lucidly written, this book will provide researchers and graduate students with the most current research on this important geological tool.
Scanning Electron Microscopy
Author | : Ludwig Reimer |
Publisher | : Springer |
Total Pages | : 538 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 3540389679 |
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Introduction to Image Processing and Analysis
Author | : John C. Russ |
Publisher | : CRC Press |
Total Pages | : 394 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1420006495 |
Image processing comprises a broad variety of methods that operate on images to produce another image. A unique textbook, Introduction to Image Processing and Analysis establishes the programming involved in image processing and analysis by utilizing skills in C compiler and both Windows and MacOS programming environments. The provided mathematical background illustrates the workings of algorithms and emphasizes the practical reasons for using certain methods, their effects on images, and their appropriate applications. The text concentrates on image processing and measurement and details the implementation of many of the most widely used and most important image processing and analysis algorithms. Homework problems are included in every chapter with solutions available for download from the CRC Press website The chapters work together to combine image processing with image analysis. The book begins with an explanation of familiar pixel array and goes on to describe the use of frequency space. Chapters 1 and 2 deal with the algorithms used in processing steps that are usually accomplished by a combination of measurement and processing operations, as described in chapters 3 and 4. The authors present each concept using a mixture of three mutually supportive tools: a description of the procedure with example images, the relevant mathematical equations behind each concept, and the simple source code (in C), which illustrates basic operations. In particularly, the source code provides a starting point to develop further modifications. Written by John Russ, author of esteemed Image Processing Handbook now in its fifth edition, this book demonstrates functions to improve an image's of features and detail visibility, improve images for printing or transmission, and facilitate subsequent analysis.
Scanning Electron Microscopy
Author | : |
Publisher | : |
Total Pages | : 490 |
Release | : 1985 |
Genre | : Electron microscopy |
ISBN | : |
Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
Scanning Electron Microscopy
Author | : Ludwig Reimer |
Publisher | : Springer |
Total Pages | : 476 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 3662135620 |
The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of Münster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec tron beam can be blanked at high frequencies for time-resolving exper iments and what problems have tobe taken into account when focusing.