Scanning Electron Microscope Examination of Wire Bonds from High-reliability Devices
| Author | : Kathryn O. Leedy |
| Publisher | : |
| Total Pages | : 40 |
| Release | : 1973 |
| Genre | : Metal bonding |
| ISBN | : |
Scanning Electron Microscope Examination Of Wire Bonds From High Reliability Devices
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Scanning Electron Microscope Examination of Wire Bonds from High-reliability Devices
| Author | : Kathryn O. Leedy |
| Publisher | : |
| Total Pages | : 40 |
| Release | : 1973 |
| Genre | : Metal bonding |
| ISBN | : |
Semiconductor Measurement Technology
| Author | : National Institute of Standards and Technology (U.S.) |
| Publisher | : |
| Total Pages | : 140 |
| Release | : 1990 |
| Genre | : Semiconductors |
| ISBN | : |
Semiconductor Measurement Technology
| Author | : United States. National Bureau of Standards |
| Publisher | : |
| Total Pages | : 48 |
| Release | : 1979 |
| Genre | : Integrated circuits |
| ISBN | : |
Monthly Catalog, United States Public Documents
| Author | : United States. Superintendent of Documents |
| Publisher | : |
| Total Pages | : 1252 |
| Release | : 1973 |
| Genre | : Government publications |
| ISBN | : |
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index.
Monthly Catalog of United States Government Publications, Cumulative Index
| Author | : United States. Superintendent of Documents |
| Publisher | : |
| Total Pages | : 1408 |
| Release | : 1976 |
| Genre | : United States |
| ISBN | : |
