Reliability Problems In Semiconductor Lasers
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Reliability of Semiconductor Lasers and Optoelectronic Devices
| Author | : Robert Herrick |
| Publisher | : Woodhead Publishing |
| Total Pages | : 336 |
| Release | : 2021-03-06 |
| Genre | : Technology & Engineering |
| ISBN | : 0128192550 |
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Advanced Laser Diode Reliability
| Author | : Massimo Vanzi |
| Publisher | : Elsevier |
| Total Pages | : 270 |
| Release | : 2021-07-24 |
| Genre | : Technology & Engineering |
| ISBN | : 0081010893 |
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
| Author | : Osamu Ueda |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 618 |
| Release | : 2012-09-22 |
| Genre | : Science |
| ISBN | : 1461443377 |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Semiconductor Laser Engineering, Reliability and Diagnostics
| Author | : Peter W. Epperlein |
| Publisher | : John Wiley & Sons |
| Total Pages | : 522 |
| Release | : 2013-01-25 |
| Genre | : Technology & Engineering |
| ISBN | : 1118481860 |
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Introduction to Semiconductor Lasers for Optical Communications
| Author | : David J. Klotzkin |
| Publisher | : Springer Nature |
| Total Pages | : 369 |
| Release | : 2020-01-07 |
| Genre | : Technology & Engineering |
| ISBN | : 3030245012 |
This updated, second edition textbook provides a thorough and accessible treatment of semiconductor lasers from a design and engineering perspective. It includes both the physics of devices as well as the engineering, designing and testing of practical lasers. The material is presented clearly with many examples provided. Readers of the book will come to understand the finer aspects of the theory, design, fabrication and test of these devices and have an excellent background for further study of optoelectronics.
Reliability and Degradation of Semiconductor Lasers and LEDs
| Author | : Mitsuo Fukuda |
| Publisher | : Artech House on Demand |
| Total Pages | : 343 |
| Release | : 1991-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 9780890064658 |
This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.
Self Focusing of Relativistic Electron Bunches in Plasma
| Author | : Valery B. Krasovitskii |
| Publisher | : Nova Publishers |
| Total Pages | : 218 |
| Release | : 2008 |
| Genre | : Science |
| ISBN | : 9781600215292 |
This volume presents the non-linear theory of electrostatic focusing of an electron beam split into bunches under conditions when the plasma permittivity at the modulation frequency is negative and the effective Coulomb force acting on the electron bunches is reversed. Conditions for the spatial equilibrium between the bunch and plasma emission, as well as the dynamics of the formation of focussed bunches, are confirmed by solving (both analytically and numerically) the self-consistent set of equations.
Wafer-Level Integrated Systems
| Author | : Stuart K. Tewksbury |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 456 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461316251 |
From the perspective of complex systems, conventional Ie's can be regarded as "discrete" devices interconnected according to system design objectives imposed at the circuit board level and higher levels in the system implementation hierarchy. However, silicon monolithic circuits have progressed to such complex functions that a transition from a philosophy of integrated circuits (Ie's) to one of integrated sys tems is necessary. Wafer-scale integration has played an important role over the past few years in highlighting the system level issues which will most significantly impact the implementation of complex monolithic systems and system components. Rather than being a revolutionary approach, wafer-scale integration will evolve naturally from VLSI as defect avoidance, fault tolerance and testing are introduced into VLSI circuits. Successful introduction of defect avoidance, for example, relaxes limits imposed by yield and cost on Ie dimensions, allowing the monolithic circuit's area to be chosen according to the natural partitioning of a system into individual functions rather than imposing area limits due to defect densities. The term "wafer level" is perhaps more appropriate than "wafer-scale". A "wafer-level" monolithic system component may have dimensions ranging from conventional yield-limited Ie dimensions to full wafer dimensions. In this sense, "wafer-scale" merely represents the obvious upper practical limit imposed by wafer sizes on the area of monolithic circuits. The transition to monolithic, wafer-level integrated systems will require a mapping of the full range of system design issues onto the design of monolithic circuit.
Semiconductor Lasers I
| Author | : Eli Kapon |
| Publisher | : Academic Press |
| Total Pages | : 467 |
| Release | : 1999-01-12 |
| Genre | : Science |
| ISBN | : 0080540929 |
This book covers the device physics of semiconductor lasers in five chapters written by recognized experts in this field. The volume begins by introducing the basic mechanisms of optical gain in semiconductors and the role of quantum confinement in modern quantum well diode lasers. Subsequent chapters treat the effects of built-in strain, one of the important recent advances in the technology of these lasers, and the physical mechanisms underlying the dynamics and high speed modulation of these devices. The book concludes with chapters addressing the control of photon states in squeezed-light and microcavity structures, and electron states in low dimensional quantum wire and quantum dot lasers. The book offers useful information for both readers unfamiliar with semiconductor lasers, through the introductory parts of each chapter, as well as a state-of-the-art discussion of some of the most advanced semiconductor laser structures, intended for readers engaged in research in this field. This book may also serve as an introduction for the companion volume, Semiconductor Lasers II: Materials and Structures, which presents further details on the different material systems and laser structures used for achieving specific diode laser performance features. - Introduces the reader to the basics of semiconductor lasers - Covers the fundamentals of lasing in semiconductors, including quantum confined and microcavity structures - Beneficial to readers interested in the more general aspects of semiconductor physics and optoelectronic devices, such as quantum confined heterostructures and integrated optics - Each chapter contains a thorough introduction to the topic geared toward the non-expert, followed by an in-depth discussion of current technology and future trends - Useful for professionals engaged in research and development - Contains numerous schematic and data-containing illustrations
