Reliability Of Nanoscale Circuits And Systems
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Author | : Miloš Stanisavljević |
Publisher | : Springer Science & Business Media |
Total Pages | : 215 |
Release | : 2010-10-20 |
Genre | : Technology & Engineering |
ISBN | : 1441962174 |
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Author | : Masashi Horiguchi |
Publisher | : Springer Science & Business Media |
Total Pages | : 221 |
Release | : 2011-01-11 |
Genre | : Technology & Engineering |
ISBN | : 1441979581 |
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Author | : Masanori Hashimoto |
Publisher | : McGraw Hill Professional |
Total Pages | : 417 |
Release | : 2014-03-07 |
Genre | : Technology & Engineering |
ISBN | : 0071787771 |
Proven methods for noise-tolerant nanoscale integrated circuit design This leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and the latest design trends, including low-power design. Power Integrity for Nanoscale Integrated Systems describes how these problems can be forecast early in the design process and the countermeasures that can be used to address them, such as the inclusion of inductance and accurate modeling for PI analysis, as well as robust circuit design. Detailed examples and a case study on the IBM POWER7+ processor illustrate real-world applications of the techniques presented in this practical resource. Coverage includes: Significance of power integrity for integrated circuits Supply and substrate noise impact on circuits Clock generation and distribution with power integrity Signal and power integrity design for I/O circuits Power integrity degradation and modeling Lumped, distributed, and 3D modeling for power integrity Chip temperature and PI impact Low-power techniques and PI impact Power integrity case study using the IBM POWER7+ processor chip Carbon nanotube interconnects for power delivery
Author | : Bhupendra Singh Reniwal |
Publisher | : CRC Press |
Total Pages | : 213 |
Release | : 2023-11-30 |
Genre | : Technology & Engineering |
ISBN | : 1000985156 |
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.
Author | : Sergey Edward Lyshevski |
Publisher | : CRC Press |
Total Pages | : 912 |
Release | : 2018-10-03 |
Genre | : Technology & Engineering |
ISBN | : 1420008145 |
There are fundamental and technological limits of conventional microfabrication and microelectronics. Scaling down conventional devices and attempts to develop novel topologies and architectures will soon be ineffective or unachievable at the device and system levels to ensure desired performance. Forward-looking experts continue to search for new paradigms to carry the field beyond the age of microelectronics, and molecular electronics is one of the most promising candidates. The Nano and Molecular Electronics Handbook surveys the current state of this exciting, emerging field and looks toward future developments and opportunities. Molecular and Nano Electronics Explained Explore the fundamentals of device physics, synthesis, and design of molecular processing platforms and molecular integrated circuits within three-dimensional topologies, organizations, and architectures as well as bottom-up fabrication utilizing quantum effects and unique phenomena. Technology in Progress Stay current with the latest results and practical solutions realized for nanoscale and molecular electronics as well as biomolecular electronics and memories. Learn design concepts, device-level modeling, simulation methods, and fabrication technologies used for today's applications and beyond. Reports from the Front Lines of Research Expert innovators discuss the results of cutting-edge research and provide informed and insightful commentary on where this new paradigm will lead. The Nano and Molecular Electronics Handbook ranks among the most complete and authoritative guides to the past, present, and future of this revolutionary area of theory and technology.
Author | : Hu, Wen-Chen |
Publisher | : IGI Global |
Total Pages | : 496 |
Release | : 2012-06-30 |
Genre | : Business & Economics |
ISBN | : 146661840X |
"This book focuses on information technology using sustainable green computing to reduce energy and resources used"--Provided by publisher.
Author | : Mourad Fakhfakh |
Publisher | : Springer |
Total Pages | : 360 |
Release | : 2015-07-14 |
Genre | : Computers |
ISBN | : 3319200712 |
This book explains the application of recent advances in computational intelligence – algorithms, design methodologies, and synthesis techniques – to the design of integrated circuits and systems. It highlights new biasing and sizing approaches and optimization techniques and their application to the design of high-performance digital, VLSI, radio-frequency, and mixed-signal circuits and systems. This second of two related volumes addresses digital and network designs and applications, with 12 chapters grouped into parts on digital circuit design, network optimization, and applications. It will be of interest to practitioners and researchers in computer science and electronics engineering engaged with the design of electronic circuits.
Author | : Management Association, Information Resources |
Publisher | : IGI Global |
Total Pages | : 2090 |
Release | : 2012-08-31 |
Genre | : Technology & Engineering |
ISBN | : 1466619465 |
Industrial engineering affects all levels of society, with innovations in manufacturing and other forms of engineering oftentimes spawning cultural or educational shifts along with new technologies. Industrial Engineering: Concepts, Methodologies, Tools, and Applications serves as a vital compendium of research, detailing the latest research, theories, and case studies on industrial engineering. Bringing together contributions from authors around the world, this three-volume collection represents the most sophisticated research and developments from the field of industrial engineering and will prove a valuable resource for researchers, academics, and practitioners alike.
Author | : Durgesh Nandan |
Publisher | : CRC Press |
Total Pages | : 342 |
Release | : 2022-11-03 |
Genre | : Computers |
ISBN | : 1000565106 |
This new volume introduces various VLSI (very-large-scale integration) architecture for DSP filters, speech filters, and image filters, detailing their key applications and discussing different aspects and technologies used in VLSI design, models and architectures, and more. The volume explores the major challenges with the aim to develop real-time hardware architecture designs that are compact and accurate. It provides useful research in the field of computer arithmetic and can be applied for various arithmetic circuits, for their digital implementation schemes, and for performance considerations.
Author | : Laung-Terng Wang |
Publisher | : Morgan Kaufmann |
Total Pages | : 893 |
Release | : 2010-07-28 |
Genre | : Technology & Engineering |
ISBN | : 0080556809 |
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.