Radiation Hardened Cmos Integrated Circuits For Time Based Signal Processing
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| Author | : Jeffrey Prinzie |
| Publisher | : Springer |
| Total Pages | : 205 |
| Release | : 2018-04-26 |
| Genre | : Technology & Engineering |
| ISBN | : 3319786164 |
This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data
| Author | : Arijit Karmakar |
| Publisher | : Springer Nature |
| Total Pages | : 154 |
| Release | : 2023-11-13 |
| Genre | : Technology & Engineering |
| ISBN | : 3031406206 |
This book covers the most recent, advanced methods for designing mixed-signal integrated circuits, for radiation-hardened sensor readouts (capacitive) and frequency synthesizers (quadrature, digitally controlled oscillators and all-digital PLL etc.). The authors discuss the ionizing radiation sources, complex failure mechanisms as well as several mitigation strategies for avoiding such failures. Readers will benefit from an introduction to the essential theory and fundamentals of ionizing radiation and time-based signal processing, with the details of the implementation of several radiation-hardened IC prototypes. The radiation-hardening methods and solutions described are supported by theory and experimental data with, underlying tradeoffs. Discusses the basics of time-based signal processing and its effectiveness in mitigating ionizing radiation Provides mitigation strategies and recommendations for reducing radiation induced effects in Integrated Circuits Includes coverage of devices used in measuring radiation, focusing on semiconductor-based radiation sensors
| Author | : Paul Leroux |
| Publisher | : MDPI |
| Total Pages | : 210 |
| Release | : 2019-08-26 |
| Genre | : Technology & Engineering |
| ISBN | : 3039212796 |
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
| Author | : Geancarlo Abich |
| Publisher | : Springer Nature |
| Total Pages | : 143 |
| Release | : 2023-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 3031185994 |
This book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.
| Author | : Baskaran Jeevarathinam |
| Publisher | : European Alliance for Innovation |
| Total Pages | : 1441 |
| Release | : 2024-01-23 |
| Genre | : Business & Economics |
| ISBN | : 1631904477 |
The International Conference on Science, Engineering and Technology Practices for Sustainable Development (ICSETPSD-23) brought researchers, scientists, engineers, industrial professionals, and scholar students for the dissemination of original research results, new ideas, and practical development experiences which concentrate on both theory and practices from around the world in all the areas of science, engineering, and technology practices for sustainable development. The theme of ICSETPSD-23 was “Science, Engineering and Technology for sustainable development”. The technical program of ICSETPSD-23 consisted of 140 full papers, scheduled for oral presentation sessions at the main conference tracks. The conference tracks were: Track 1 – Science for sustainable development; Track 2 – Sustainability through Engineering; Track 3 – Sustainable developments in Health Care; and Track 4 – Technology practices for sustainability. Aside from the high quality technical paper presentations, the technical program also featured eight keynote speeches and one invited talk. We strongly believe that ICSETPSD-23 conference provides a good forum for all researchers, developers, and practitioners to discuss all science and technology aspects that are relevant to sustainable developments. We also expect that the future ICSETPSD conference will be as successful and stimulating, as indicated by the contributions presented in this volume.
| Author | : Ying Cao |
| Publisher | : Springer |
| Total Pages | : 128 |
| Release | : 2015-02-09 |
| Genre | : Technology & Engineering |
| ISBN | : 3319118420 |
This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment. Several radiation-hardened-by-design (RHBD) techniques are demonstrated throughout the design of the TDC and other circuit techniques to improve the TDC's resolution in a harsh environment are also investigated. Readers can learn from scratch how to design a radiation-tolerant IC. Information regarding radiation effects, radiation-hardened design techniques and measurements are organized in such a way that readers can easily gain a thorough understanding of the topic. Readers will also learn the design theory behind the newly proposed delta-sigma TDC. Readers can quickly acquire knowledge about the design of radiation-hardened bandgap voltage references and low-jitter relaxation oscillators, which are introduced in the content from a designer's perspective. · Discusses important aspects of radiation-tolerant analog IC design, including realistic applications and radiation effects on ICs; · Demonstrates radiation-hardened-by-design techniques through a design-test-radiation assessment practice; · Describes a new type of Time-to-Digital (TDC) converter designed for radiation-tolerant application; · Explains the design and measurement of all functional blocks (e.g., bandgap reference, relaxation oscillator) in the TDC.
| Author | : Dan M. Fleetwood |
| Publisher | : World Scientific |
| Total Pages | : 354 |
| Release | : 2004 |
| Genre | : Technology & Engineering |
| ISBN | : 9789812794703 |
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
| Author | : |
| Publisher | : |
| Total Pages | : 2264 |
| Release | : 1992 |
| Genre | : Engineering |
| ISBN | : |
Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
| Author | : |
| Publisher | : |
| Total Pages | : 836 |
| Release | : 1994 |
| Genre | : Aeronautics |
| ISBN | : |
| Author | : Renato Turchetta |
| Publisher | : CRC Press |
| Total Pages | : 257 |
| Release | : 2017-12-19 |
| Genre | : Technology & Engineering |
| ISBN | : 1351830228 |
Analog Electronics for Radiation Detection showcases the latest advances in readout electronics for particle, or radiation, detectors. Featuring chapters written by international experts in their respective fields, this authoritative text: Defines the main design parameters of front-end circuitry developed in microelectronics technologies Explains the basis for the use of complementary metal–oxide semiconductor (CMOS) image sensors for the detection of charged particles and other non-consumer applications Delivers an in-depth review of analog-to-digital converters (ADCs), evaluating the pros and cons of ADCs integrated at the pixel, column, and per-chip levels Describes incremental sigma–delta ADCs, time-to-digital converter (TDC) architectures, and digital pulse-processing techniques complementary to analog processing Examines the fundamental parameters and front-end types associated with silicon photomultipliers used for single visible-light photon detection Discusses pixel sensors with per-pixel TDCs, channel density challenges, and emerging 3D technologies interconnecting detectors and electronics Thus, Analog Electronics for Radiation Detection provides a single source for state-of-the-art information on analog electronics for the readout of radiation detectors.
