EDN.

EDN.
Author:
Publisher:
Total Pages: 1260
Release: 1987
Genre: Electrical engineering
ISBN:

Proceedings

Proceedings
Author: Enrique Fernandez
Publisher:
Total Pages: 212
Release: 1989
Genre:
ISBN: 9789290830177

Microelectronic Reliability: Reliability, test and diagnostics

Microelectronic Reliability: Reliability, test and diagnostics
Author: Edward B. Hakim
Publisher: Artech House Publishers
Total Pages: 400
Release: 1989
Genre: Technology & Engineering
ISBN:

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought