Quantitative Surface Analysis of Materials
Author | : Symposium on Progress in Quantitative Surface Analysis |
Publisher | : ASTM International |
Total Pages | : 220 |
Release | : 1986-03 |
Genre | : Analytical chemistry |
ISBN | : 9780803105430 |
Download Quantitative Surface Analysis Of Materials full books in PDF, epub, and Kindle. Read online free Quantitative Surface Analysis Of Materials ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : Symposium on Progress in Quantitative Surface Analysis |
Publisher | : ASTM International |
Total Pages | : 220 |
Release | : 1986-03 |
Genre | : Analytical chemistry |
ISBN | : 9780803105430 |
Author | : Graham C. Smith |
Publisher | : Maney Publishing |
Total Pages | : 194 |
Release | : 1991 |
Genre | : Technology & Engineering |
ISBN | : |
Discusses the range of methods used to describe the structure, composition, and chemical nature of material surfaces, comparing the merits of each. The techniques standardly used in analytical laboratories auger electron and x-ray photoelectron spectroscopy, and secondary mass ion spectrometry are d
Author | : John F. Watts |
Publisher | : John Wiley & Sons |
Total Pages | : 320 |
Release | : 2019-08-27 |
Genre | : Technology & Engineering |
ISBN | : 1119417643 |
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author | : D.J. O'Connor |
Publisher | : Springer Science & Business Media |
Total Pages | : 588 |
Release | : 2013-06-29 |
Genre | : Technology & Engineering |
ISBN | : 366205227X |
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author | : Siegfried Hofmann |
Publisher | : Springer Science & Business Media |
Total Pages | : 544 |
Release | : 2012-10-25 |
Genre | : Science |
ISBN | : 3642273807 |
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author | : William M. Haynes |
Publisher | : CRC Press |
Total Pages | : 2643 |
Release | : 2016-06-22 |
Genre | : Science |
ISBN | : 1498754295 |
Proudly serving the scientific community for over a century, this 97th edition of the CRC Handbook of Chemistry and Physics is an update of a classic reference, mirroring the growth and direction of science. This venerable work continues to be the most accessed and respected scientific reference in the world. An authoritative resource consisting of tables of data and current international recommendations on nomenclature, symbols, and units, its usefulness spans not only the physical sciences but also related areas of biology, geology, and environmental science. The 97th edition of the Handbook includes 20 new or updated tables along with other updates and expansions. It is now also available as an eBook. This reference puts physical property data and mathematical formulas used in labs and classrooms every day within easy reach.
Author | : Alvin W. Czanderna |
Publisher | : Springer Science & Business Media |
Total Pages | : 479 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1461537088 |
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Author | : R.W. Cahn |
Publisher | : Elsevier |
Total Pages | : 670 |
Release | : 2016-01-22 |
Genre | : Technology & Engineering |
ISBN | : 1483287513 |
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
Author | : United States. National Bureau of Standards |
Publisher | : |
Total Pages | : 702 |
Release | : 1979 |
Genre | : Government publications |
ISBN | : |