Progress in VLSI Design and Test

Progress in VLSI Design and Test
Author: Hafizur Rahaman
Publisher: Springer
Total Pages: 427
Release: 2012-06-26
Genre: Computers
ISBN: 3642314945

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

VLSI Design and Test

VLSI Design and Test
Author: Brajesh Kumar Kaushik
Publisher: Springer
Total Pages: 820
Release: 2017-12-21
Genre: Computers
ISBN: 9811074704

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
Total Pages: 690
Release: 2006-04-11
Genre: Technology & Engineering
ISBN: 0306470403

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Progress in Computing, Analytics and Networking

Progress in Computing, Analytics and Networking
Author: Prasant Kumar Pattnaik
Publisher: Springer
Total Pages: 826
Release: 2018-04-10
Genre: Technology & Engineering
ISBN: 9811078718

The book focuses to foster new and original research ideas and results in three broad areas: computing, analytics, and networking with its prospective applications in the various interdisciplinary domains of engineering. This is an exciting and emerging interdisciplinary area in which a wide range of theory and methodologies are being investigated and developed to tackle complex and challenging real world problems. It also provides insights into the International Conference on Computing Analytics and Networking (ICCAN 2017) which is a premier international open forum for scientists, researchers and technocrats in academia as well as in industries from different parts of the world to present, interact, and exchange the state of art of concepts, prototypes, innovative research ideas in several diversified fields. The book includes invited keynote papers and paper presentations from both academia and industry to initiate and ignite our young minds in the meadow of momentous research and thereby enrich their existing knowledge. The book aims at postgraduate students and researchers working in the discipline of Computer Science & Engineering. It will be also useful for the researchers working in the domain of electronics as it contains some hardware technologies and forthcoming communication technologies.

Advanced VLSI Design and Testability Issues

Advanced VLSI Design and Testability Issues
Author: Suman Lata Tripathi
Publisher: CRC Press
Total Pages: 379
Release: 2020-08-18
Genre: Technology & Engineering
ISBN: 1000168158

This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.

'Advances in Microelectronics: Reviews', Vol_1

'Advances in Microelectronics: Reviews', Vol_1
Author: Sergey Yurish
Publisher: Lulu.com
Total Pages: 536
Release: 2017-12-24
Genre: Technology & Engineering
ISBN: 8469786334

The 1st volume of 'Advances in Microelectronics: Reviews' Book Series contains 19 chapters written by 72 authors from academia and industry from 16 countries. With unique combination of information in each volume, the 'Advances in Microelectronics: Reviews' Book Series will be of value for scientists and engineers in industry and at universities. In order to offer a fast and easy reading of the state of the art of each topic, every chapter in this book is independent and self-contained. All chapters have the same structure: first an introduction to specific topic under study; second particular field description including sensing applications. Each of chapter is ending by well selected list of references with books, journals, conference proceedings and web sites. This book ensures that readers will stay at the cutting edge of the field and get the right and effective start point and road map for the further researches and developments.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
Author: Laung-Terng Wang
Publisher: Elsevier
Total Pages: 809
Release: 2006-08-14
Genre: Technology & Engineering
ISBN: 0080474799

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Advances in VLSI, Communication, and Signal Processing

Advances in VLSI, Communication, and Signal Processing
Author: Debashis Dutta
Publisher: Springer Nature
Total Pages: 1004
Release: 2019-12-03
Genre: Technology & Engineering
ISBN: 9813297751

This book comprises select proceedings of the International Conference on VLSI, Communication and Signal processing (VCAS 2018). It looks at latest research findings in VLSI design and applications. The book covers a wide range of topics in electronics and communication engineering, especially in the area of microelectronics and VLSI design, communication systems and networks, and image and signal processing. The contents of this book will be useful to researchers and professionals alike.

Proceedings of First International Conference on Information and Communication Technology for Intelligent Systems: Volume 2

Proceedings of First International Conference on Information and Communication Technology for Intelligent Systems: Volume 2
Author: Suresh Chandra Satapathy
Publisher: Springer
Total Pages: 595
Release: 2016-05-03
Genre: Technology & Engineering
ISBN: 3319309277

This volume contains 60 papers presented at ICTIS 2015: International Conference on Information and Communication Technology for Intelligent Systems. The conference was held during 28th and 29th November, 2015, Ahmedabad, India and organized communally by Venus International College of Technology, Association of Computer Machinery, Ahmedabad Chapter and Supported by Computer Society of India Division IV – Communication and Division V – Education and Research. This volume contains papers mainly focused on ICT and its application for Intelligent Computing, Cloud Storage, Data Mining, Image Processing and Software Analysis etc.

Advances in Computer Science for Engineering and Education

Advances in Computer Science for Engineering and Education
Author: Zhengbing Hu
Publisher: Springer
Total Pages: 785
Release: 2018-05-11
Genre: Technology & Engineering
ISBN: 3319910086

This book features high-quality, peer-reviewed research papers presented at the First International Conference on Computer Science, Engineering and Education Applications (ICCSEEA2018), held in Kiev, Ukraine on 18–20 January 2018, and organized jointly by the National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute” and the International Research Association of Modern Education and Computer Science. The state-of-the-art papers discuss topics in computer science, such as neural networks, pattern recognition, engineering techniques, genetic coding systems, deep learning with its medical applications, as well as knowledge representation and its applications in education. It is an excellent reference resource for researchers, graduate students, engineers, management practitioners, and undergraduate students interested in computer science and their applications in engineering and education.