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| Author | : |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 306 |
| Release | : 2002 |
| Genre | : Technology & Engineering |
| ISBN | : |
| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 540 |
| Release | : 2019-12-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627082735 |
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 666 |
| Release | : 2017-12-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627081518 |
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
| Author | : |
| Publisher | : ASM International |
| Total Pages | : 479 |
| Release | : 2011 |
| Genre | : Technology & Engineering |
| ISBN | : 1615038507 |
| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 643 |
| Release | : 2012 |
| Genre | : Technology & Engineering |
| ISBN | : 1615039953 |
| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 372 |
| Release | : 2007-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1615030905 |
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
| Author | : A. S. M. International |
| Publisher | : ASM International |
| Total Pages | : 561 |
| Release | : 2014-11-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627080740 |
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
| Author | : Jinghan He |
| Publisher | : Springer Nature |
| Total Pages | : 1382 |
| Release | : 2022-04-22 |
| Genre | : Technology & Engineering |
| ISBN | : 9811915326 |
This book gathers outstanding papers presented at the 16th Annual Conference of China Electrotechnical Society, organized by China Electrotechnical Society (CES), held in Beijing, China, from September 24 to 26, 2021. It covers topics such as electrical technology, power systems, electromagnetic emission technology, and electrical equipment. It introduces the innovative solutions that combine ideas from multiple disciplines. The book is very much helpful and useful for the researchers, engineers, practitioners, research students, and interested readers.
| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 524 |
| Release | : 2005-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1615030883 |
