17th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : |
| Total Pages | : 0 |
| Release | : 1999 |
| Genre | : Integrated circuits |
| ISBN | : 9780769501468 |
Proceedings Of 17th Ieee Vlsi Test Symposium
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17th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 534 |
| Release | : 1999 |
| Genre | : Computers |
| ISBN | : 9780769501468 |
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
16th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : |
| Total Pages | : 520 |
| Release | : 1998 |
| Genre | : Application-specific integrated circuits |
| ISBN | : 9780818684364 |
IEEE VLSI Test Symposium
| Author | : |
| Publisher | : |
| Total Pages | : 498 |
| Release | : 2005 |
| Genre | : Application-specific integrated circuits |
| ISBN | : |
19th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 417 |
| Release | : 2001 |
| Genre | : Application-specific integrated circuits |
| ISBN | : 9780769511238 |
Proceedings
| Author | : |
| Publisher | : IEEE |
| Total Pages | : 452 |
| Release | : 2002 |
| Genre | : Computers |
| ISBN | : 9780769515700 |
This volume originates from the 20th IEEE VLSI Test Symposium, and is concerned with computer engineering. It is aimed at researchers, professors, practitioners and students.
