The Growth of Electron Microscopy

The Growth of Electron Microscopy
Author:
Publisher: Academic Press
Total Pages: 919
Release: 1996-08-05
Genre: Science
ISBN: 0080577628

As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics
Author:
Publisher: Academic Press
Total Pages: 269
Release: 2015-06-09
Genre: Technology & Engineering
ISBN: 0128025905

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK
Author: P.B. Kenway
Publisher: CRC Press
Total Pages: 684
Release: 2020-10-08
Genre: Science
ISBN: 1000157083

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

NIST Serial Holdings

NIST Serial Holdings
Author: National Institute of Standards and Technology (U.S.)
Publisher:
Total Pages: 268
Release: 2002
Genre: Engineering
ISBN:

Publications

Publications
Author: United States. National Bureau of Standards
Publisher:
Total Pages: 766
Release: 1977
Genre: Government publications
ISBN: