Tenth International Symposium on Software Reliability Engineering

Tenth International Symposium on Software Reliability Engineering
Author: IEEE Computer Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Total Pages: 322
Release: 1999
Genre: Computers
ISBN: 9780769504438

The theme of the November 1999 symposium deals with which technologies to take into the new millennium and which ones to leave behind. The 32 papers address software reliability techniques models, reliability and safety, object-oriented testing and modeling, quality, testing, and early quality prediction. Some of the topics are rare failure-state in a Markov chain model for software reliability, classification tree models of software quality over multiple releases, mutation testing applied to validate specifications based on statecharts, generating test cases from an OO model with an AI planning system, and requirements volatility and defect density. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.