Practical X Ray Spectrometry
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| Author | : JENKINS |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 203 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 1468462822 |
X-ray fluorescenct" spectrometry is now widely accepted as a highly versatile and potentially accurate method of instrumental elemental analysis and so it is somewhat surprising that although the volume of published work dealing with the technique is high the number of textbooks dealing exclusively with its application is relatively few. Without wishing to detract from the excellence of the textbooks which are already available we have both felt for some time, that a great need exists for a book dealing with the more practical aspects of the subject. For a number of years we have been associated with the provision and arrangement of X-ray schools for the training of new X-ray spectroscopists as well as in the organisation of conferences and sym posia whose aims have been to keep the more experienced workers abreast with the latest developments in instrumentation and techniques. In all of these ventures we have found a considerable dearth of reference work dealing with the reasons why an X-ray method has not succeeded as opposed to the multitude of success stories which regularly saturate the scientific press. In this book, which is based on lecture notes from well established courses in X-ray fluorescence spectrometry, we have tried to cover all of the more usual practical difficulties experienced in the application of the method and we have endeavoured to keep the amount of purely theoretical data at a minimum.
| Author | : Ron Jenkins |
| Publisher | : CRC Press |
| Total Pages | : 512 |
| Release | : 1995-04-26 |
| Genre | : Science |
| ISBN | : 9780824795542 |
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
| Author | : Burkhard Beckhoff |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 897 |
| Release | : 2007-05-18 |
| Genre | : Science |
| ISBN | : 3540367225 |
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
| Author | : Gordon Gilmore |
| Publisher | : John Wiley & Sons |
| Total Pages | : 597 |
| Release | : 2011-09-07 |
| Genre | : Science |
| ISBN | : 1119964695 |
The Second Edition of Practical Gamma-Ray Spectrometry has been completely revised and updated, providing comprehensive coverage of the whole gamma-ray detection and spectrum analysis processes. Drawn on many years of teaching experience to produce this uniquely practical volume, issues discussed include the origin of gamma-rays and the issue of quality assurance in gamma-ray spectrometry. This new edition also covers the analysis of decommissioned nuclear plants, computer modelling systems for calibration, uncertainty measurements in QA, and many more topics.
| Author | : Michael Haschke |
| Publisher | : John Wiley & Sons |
| Total Pages | : 496 |
| Release | : 2021-04-05 |
| Genre | : Science |
| ISBN | : 3527344632 |
Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.
| Author | : Rene Van Grieken |
| Publisher | : CRC Press |
| Total Pages | : 1016 |
| Release | : 2001-11-27 |
| Genre | : Science |
| ISBN | : 9780203908709 |
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
| Author | : P. J. Potts |
| Publisher | : Royal Society of Chemistry |
| Total Pages | : 305 |
| Release | : 2008 |
| Genre | : Science |
| ISBN | : 085404552X |
This book brings together the knowledge and expertise of internationally recognised scientists with practical experience of in situ analysis using portable X-ray fluorescence technology.
| Author | : P.J. Potts |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 633 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 940153988X |
without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.
| Author | : Joseph Goldstein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 679 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 1461332737 |
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
| Author | : Victor E. Buhrke |
| Publisher | : Wiley-VCH |
| Total Pages | : 0 |
| Release | : 1997-11-19 |
| Genre | : Science |
| ISBN | : 9780471194583 |
The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references.
