Practical Guide To Surface Science And Spectroscopy
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| Author | : Yip-Wah Chung |
| Publisher | : Elsevier |
| Total Pages | : 201 |
| Release | : 2012-12-02 |
| Genre | : Science |
| ISBN | : 0080497780 |
Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time. - Both theory and practice are emphasized - Logical organization allows one to get up to speed on any given topic quickly - Numerous examples, questions for discussion and practice problems are included - The CD includes animation and interactive elements that help to convey difficult concepts
| Author | : John T. Yates Jr. |
| Publisher | : Springer |
| Total Pages | : 637 |
| Release | : 2015-08-17 |
| Genre | : Science |
| ISBN | : 3319176684 |
This book is a new edition of a classic text on experimental methods and instruments in surface science. It offers practical insight useful to chemists, physicists, and materials scientists working in experimental surface science. This enlarged second edition contains almost 300 descriptions of experimental methods. The more than 50 active areas with individual scientific and measurement concepts and activities relevant to each area are presented in this book. The key areas covered are: Vacuum System Technology, Mechanical Fabrication Techniques, Measurement Methods, Thermal Control, Delivery of Adsorbates to Surfaces, UHV Windows, Surface Preparation Methods, High Area Solids, Safety. The book is written for researchers and graduate students.
| Author | : John Hudson |
| Publisher | : Elsevier |
| Total Pages | : 336 |
| Release | : 2013-10-22 |
| Genre | : Science |
| ISBN | : 0080966969 |
The whole field of surface science is covered in this work. Starting with a description of the structure and thermodynamics of clean surfaces, the book goes on to discuss kinetic theory of gases and molecular beam formation. This is followed by a largesection on gas-surface interactions, and another major section on energetic particle-surface interactions. The final chapter provides the background to crystal nucleation and growth. The approach adopted is interdisciplinary and slanted towards theexperimental side, with practical analytical techniques being used to illustrate general principles.
| Author | : D.J. O'Connor |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 588 |
| Release | : 2013-06-29 |
| Genre | : Technology & Engineering |
| ISBN | : 366205227X |
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
| Author | : Siegfried Hofmann |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 544 |
| Release | : 2012-10-25 |
| Genre | : Science |
| ISBN | : 3642273807 |
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
| Author | : J.M. Walls |
| Publisher | : Elsevier |
| Total Pages | : 197 |
| Release | : 2013-10-22 |
| Genre | : Science |
| ISBN | : 1483287882 |
This volume provides a comprehensive and up to the minute review of the techniques used to determine the nature and composition of surfaces. Originally published as a special issue of the Pergamon journal Vacuum, it comprises a carefully edited collection of chapters written by specialists in each of the techniques and includes coverage of the electron and ion spectroscopies, as well as the atom-imaging methods such as the atom probe field ion microscope and the scanning tunnelling microscope. Surface science is an important area of study since the outermost surface layers play a crucial role in processses such as catalysis, adhesion, wear, and corrosion, with applications in metallurgy, thin films and surface coatings, the chemicals and polymer industries, and microelectronics, to name a few. This book covers those techniques used routinely for surface analysis as well as those employed for more fundamental scientific studies. It will be of interest to university research workers, graduate students and to industrial scientists solving practical problems.
| Author | : John T., Jr. Yates |
| Publisher | : Springer |
| Total Pages | : 0 |
| Release | : 2014-01-14 |
| Genre | : Technology & Engineering |
| ISBN | : 9781461223047 |
Providing the "tricks of the trade" in surface science, this book describes hundreds of techniques, methods, instruments, and tools in common use from the worlds of physics, chemistry, and engineering. The methods are arranged in topical groupings for easy reference, and each is described succinctly, with a clear sketch of the apparatus involved. Covering all the basic methods of surface science, this source book will serve not only as a useful reference to those just starting on experimental research in surface science, but also as a "vade mecum" for established researchers.
| Author | : David Briggs |
| Publisher | : John Wiley & Sons |
| Total Pages | : 556 |
| Release | : 1983 |
| Genre | : Science |
| ISBN | : |
| Author | : Stephen F. Tonkin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 212 |
| Release | : 2013-11-11 |
| Genre | : Science |
| ISBN | : 1447101278 |
This book contains everything an amateur astronomer needs to know to begin observing whilst going relatively deeply into the subject for those who are already involved. Covers a very wide range of available equipment, from simple DIY spectroscopes to the most expensive commercially-made instruments. Describes basic principles so that the reader understands how to analyse the spectra he/she sees or records. Contributions by leading amateurs astronomers from the USA and Europe.
| Author | : Howard J. Humecki |
| Publisher | : CRC Press |
| Total Pages | : 490 |
| Release | : 1995-01-23 |
| Genre | : Science |
| ISBN | : 9780824794491 |
This work represents a sound introduction to the fundamental principles of infrared microspectroscopy (IMS). It describes how IMS is used to solve specific microanalytical problems in a variety of disciplines, including forensic analysis, art conservation, and geological, pharmaceutical and electronics research. The book discusses when and how to use special techniques such as line scanning, 3-dimensional imaging and attenuated total reflection and grazing-angle spectroscopy.
