Physical Aspects of Electron Microscopy and Microbeam Analysis

Physical Aspects of Electron Microscopy and Microbeam Analysis
Author: Benjamin M. Siegel
Publisher:
Total Pages: 496
Release: 1975
Genre: Science
ISBN:

Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems.

Physical Aspects of Electron Microscopy and Microbeam Analysis

Physical Aspects of Electron Microscopy and Microbeam Analysis
Author: Benjamin M. Siegel
Publisher:
Total Pages: 498
Release: 1975
Genre: Science
ISBN:

Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems.

Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: R.F. Egerton
Publisher: Springer
Total Pages: 203
Release: 2016-07-01
Genre: Technology & Engineering
ISBN: 3319398776

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Electron Microscopy and Analysis, Third Edition

Electron Microscopy and Analysis, Third Edition
Author: Peter J. Goodhew
Publisher: CRC Press
Total Pages: 274
Release: 2000-11-30
Genre: Technology & Engineering
ISBN: 9780748409686

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.