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| Author | : Benjamin M. Siegel |
| Publisher | : |
| Total Pages | : 496 |
| Release | : 1975 |
| Genre | : Science |
| ISBN | : |
Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems.
| Author | : Benjamin M. Siegel |
| Publisher | : |
| Total Pages | : 474 |
| Release | : 1975 |
| Genre | : Electron microscopes |
| ISBN | : |
| Author | : R.F. Egerton |
| Publisher | : Springer |
| Total Pages | : 203 |
| Release | : 2016-07-01 |
| Genre | : Technology & Engineering |
| ISBN | : 3319398776 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
| Author | : Ray Egerton |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 224 |
| Release | : 2011-02-11 |
| Genre | : Technology & Engineering |
| ISBN | : 9780387258003 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
| Author | : Peter J. Goodhew |
| Publisher | : CRC Press |
| Total Pages | : 274 |
| Release | : 2000-11-30 |
| Genre | : Technology & Engineering |
| ISBN | : 9780748409686 |
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
| Author | : Milos Janecek |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 302 |
| Release | : 2016-02-18 |
| Genre | : Science |
| ISBN | : 9535122525 |
This book brings a broad review of recent global developments in theory, instrumentation, and practical applications of electron microscopy. It was created by 13 contributions from experts in different fields of electron microscopy and technology from over 20 research institutes worldwide.
| Author | : Benjamin M. Siegel |
| Publisher | : |
| Total Pages | : 498 |
| Release | : 1975 |
| Genre | : Science |
| ISBN | : |
Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems.
| Author | : Peter J. Goodhew |
| Publisher | : CRC Press |
| Total Pages | : 248 |
| Release | : 1988-04-25 |
| Genre | : Science |
| ISBN | : 9780850664140 |
A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.
| Author | : S. Amelinckx |
| Publisher | : John Wiley & Sons |
| Total Pages | : 527 |
| Release | : 2008-09-26 |
| Genre | : Technology & Engineering |
| ISBN | : 3527614559 |
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
