Surface Analysis of Paper

Surface Analysis of Paper
Author: Terrance E. Conners
Publisher: CRC Press
Total Pages: 357
Release: 2020-04-15
Genre: Science
ISBN: 1000693473

First published in 1995, Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper. Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods. Each chapter contains: An introduction A description of the technique A discussion of the type of information that can be obtained with the particular technique Practical examples to demonstrate the advantages of the technique

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
Author: Rodenburg
Publisher: CRC Press
Total Pages: 716
Release: 1997-01-01
Genre: Technology & Engineering
ISBN: 9780750304412

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

Petrophysics

Petrophysics
Author: Djebbar Tiab
Publisher: Elsevier
Total Pages: 976
Release: 2024-03-27
Genre: Business & Economics
ISBN: 0443241287

Petrophysics, a seminal text in the field authored by recognized experts, now in its 5th edition, delivers information for reservoir engineers, production engineers and geoscience students fundamental to understanding rock-fluid interaction, and critical to maximizing reservoir performance while minimizing emissions and environmental impacts. This new edition lays a foundation through an introduction to petroleum geology, including an overview of pre- and post- carbon emission concerns, porosity and permeability, formation resistivity and water saturation, capillary pressure, wettability, applications of Darcy's Law, naturally fractured reservoirs, stress effects on reservoir rock, reservoir characterization and well logs, fluid-rock interactions, shale gas and shale oil in unconventional reservoirs, and culminates in current studies on permeability from practical interpretation of pressure and rate transient analysis of tight and shale reservoirs. Each chapter synthesizes relevant theory, studies and advances, methods, procedures, calculations, definitions, exercises and assignments designed to reinforce learning. • Continues its longstanding, 28-year history as the leading book on petrophysics• Captures advances in field technologies, reservoir evaluation and testing, porosity, permeability, updated calculations and indices in wettability, permeability, brittleness and fracability.• Includes up-to-date discussions on carbon footprints and strategies to reduce emissions• Each chapter synthesizes relevant theory, studies and advances, methods, procedures, calculations, definitions, exercises and assignments designed to reinforce learning

Defect Recognition and Image Processing in Semiconductors 1997

Defect Recognition and Image Processing in Semiconductors 1997
Author: J. Doneker
Publisher: Routledge
Total Pages: 552
Release: 2017-11-22
Genre: Science
ISBN: 1351456466

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.