Optical techniques to measure short wave structure have been developed into working in situ devices in recent years. These devices generally fall into two categories, one category contains devices that make instantaneous 'maps' of surface slope in two dimensional space, and the other category makes time and space series of surface slope at a single point. This paper describes results obtained with a device from the latter category. Data analysis is performed to compute an estimate of surface curvature and it is compared to a short-time scale measurement of wind speed and microlayer chemical enrichment.