Neutron And X Ray Optics
Download Neutron And X Ray Optics full books in PDF, epub, and Kindle. Read online free Neutron And X Ray Optics ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
| Author | : Jay Theodore Cremer Jr. |
| Publisher | : Newnes |
| Total Pages | : 1124 |
| Release | : 2013-02-18 |
| Genre | : Science |
| ISBN | : 0124071597 |
Covering a wide range of topics related to neutron and x-ray optics, this book explores the aspects of neutron and x-ray optics and their associated background and applications in a manner accessible to both lower-level students while retaining the detail necessary to advanced students and researchers. It is a self-contained book with detailed mathematical derivations, background, and physical concepts presented in a linear fashion. A wide variety of sources were consulted and condensed to provide detailed derivations and coverage of the topics of neutron and x-ray optics as well as the background material needed to understand the physical and mathematical reasoning directly related or indirectly related to the theory and practice of neutron and x-ray optics. The book is written in a clear and detailed manner, making it easy to follow for a range of readers from undergraduate and graduate science, engineering, and medicine. It will prove beneficial as a standalone reference or as a complement to textbooks. - Supplies a historical context of covered topics. - Detailed presentation makes information easy to understand for researchers within or outside the field. - Incorporates reviews of all relevant literature in one convenient resource.
| Author | : Alexei Erko |
| Publisher | : Springer |
| Total Pages | : 541 |
| Release | : 2008-04-01 |
| Genre | : Science |
| ISBN | : 3540745610 |
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.
| Author | : Mikhail A. Krivoglaz |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 483 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3642742912 |
Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).
| Author | : Eberhard Spiller |
| Publisher | : SPIE Press |
| Total Pages | : 296 |
| Release | : 1994 |
| Genre | : Medical |
| ISBN | : 9780819416544 |
This text describes optics mainly in the 10 to 500 angstrom wavelength region. These wavelengths are 50 to 100 times shorter than those for visible light and 50 to 100 times longer than the wavelengths of medical x rays or x-ray diffraction from natural crystals. There have been substantial advances during the last 20 years, which one can see as an extension of optical technology to shorter wavelengths or as an extension of x-ray diffraction to longer wavelengths. Artificial diffracting structures like zone plates and multilayer mirrors are replacing the natural crystals of x-ray diffraction. Some of these structures can now be fabricated to have diffraction-limited resolution. The new possibilities are described in a simple, tutorial way.
| Author | : André Authier |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 419 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 1461558794 |
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
| Author | : Jean Daillant |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 347 |
| Release | : 2003-07-01 |
| Genre | : Science |
| ISBN | : 3540486968 |
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
| Author | : Eugen Mircea Anitas |
| Publisher | : Springer |
| Total Pages | : 121 |
| Release | : 2019-08-08 |
| Genre | : Science |
| ISBN | : 3030266125 |
This book addresses the basic physical phenomenon of small-angle scattering (SAS) of neutrons, x-rays or light from complex hierarchical nano- and micro-structures. The emphasis is on developing theoretical models for the material structure containing self-similar or fractal clusters. Within the suggested framework, key approaches for extracting structural information from experimental scattering data are investigated and presented in detail. The range of parameters which can be obtained pave the road towards a better understanding of the correlations between geometrical and various physical properties (electrical, magnetic, mechanical, optical, dynamical, transport etc.) in fractal nano- and micro-materials.
| Author | : Janice L. Bishop |
| Publisher | : Cambridge University Press |
| Total Pages | : 655 |
| Release | : 2019-11-28 |
| Genre | : Language Arts & Disciplines |
| ISBN | : 110718620X |
Comprehensive overview of the spectroscopic, mineralogical, and geochemical techniques used in planetary remote sensing.
| Author | : Alexei Erko |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 540 |
| Release | : 2008-04-14 |
| Genre | : Technology & Engineering |
| ISBN | : 3540745602 |
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.
| Author | : Françoise Hippert |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 580 |
| Release | : 2006-07-08 |
| Genre | : Science |
| ISBN | : 1402033370 |
- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books
