Neutron and Synchrotron Radiation for Condensed Matter Studies

Neutron and Synchrotron Radiation for Condensed Matter Studies
Author: Jose Baruchel
Publisher: Springer Science & Business Media
Total Pages: 347
Release: 2013-12-18
Genre: Science
ISBN: 366222223X

This second volume in the HERCULES Course on Neutron and Synchrotron Radiation for Condensed Matter Studies is devoted to selected applications in physics and chemistry of solids, with the fourteen chapters ranging from general considerations of symmetry in condensed matter to the most recent developments in magnetic excitations and electron spectroscopies in high Tc superconductors. The subjects were chosen either for their basic importance or because of interesting new developments, while the fifteen authors were selected both for their high scientific expertise and their teaching skills.

Neutron and Synchrotron Radiation for Condensed Matter Studies

Neutron and Synchrotron Radiation for Condensed Matter Studies
Author: Jose Baruchel
Publisher: Springer
Total Pages: 332
Release: 1994-04-07
Genre: Technology & Engineering
ISBN: 9783540576938

The present volume is the third and last in the series based on the HERCULES Course on Neutron and Synchrotron Radiation for Condensed Matter Studies. It covers selected applications of neutron and synchrotron radiation to soft condensed matter (introduction plus 7 chapters) and biology (introduction plus 10 chapters). The fields are extremely wide, so only some selected topics representative of recent interest and developments are reported. The authors were selected for their scientific expertise and teaching skills. An index covering the content of all three volumes is included.

Soft-Matter Characterization

Soft-Matter Characterization
Author: Redouane Borsali
Publisher: Springer Science & Business Media
Total Pages: 1490
Release: 2008-07-28
Genre: Science
ISBN: 140204464X

This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.

International Tables for Crystallography,Volume C

International Tables for Crystallography,Volume C
Author: E. Prince
Publisher: Springer Science & Business Media
Total Pages: 1033
Release: 2004-01-31
Genre: Science
ISBN: 1402019009

International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). The purpose of Volume C is to provide the mathematical, physical and chemical information needed for experimental studies in structural crystallography. The volume covers all aspects of experimental techniques, using all three principal radiation types, from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. As such, it is an essential source of information for all workers using crystallographic techniques in physics, chemistry, metallurgy, earth sciences and molecular biology.

Neutron and X-ray Spectroscopy

Neutron and X-ray Spectroscopy
Author: Françoise Hippert
Publisher: Springer Science & Business Media
Total Pages: 580
Release: 2006-07-08
Genre: Science
ISBN: 1402033370

- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Author: M.E. Fitzpatrick
Publisher: CRC Press
Total Pages: 368
Release: 2003-02-06
Genre: Science
ISBN: 0203608992

While residual stress can be a problem in many industries and lead to early failure of component, it can also be introduced deliberately to improve lifetimes. Knowledge of the residual stress state in a component can be critical for quality control of surface engineering processes or vital to performing an accurate assessment of component life unde