National Semiconductor Metrology Program Semiconductor Electronics Division Nist List Of Publications Lp 103 March 1999
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National Semiconductor Metrology Program
Author | : National Semiconductor Metrology Program (U.S.) |
Publisher | : |
Total Pages | : 148 |
Release | : 1999 |
Genre | : Semiconductors |
ISBN | : |
National Semiconductor Metrology Program
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 148 |
Release | : 1999 |
Genre | : Semiconductors |
ISBN | : |
Publications of the National Institute of Standards and Technology ... Catalog
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 1162 |
Release | : 1994 |
Genre | : |
ISBN | : |
First Text Retrieval Conference (TREC-1)
Author | : D. K. Harman |
Publisher | : DIANE Publishing |
Total Pages | : 527 |
Release | : 1995-10 |
Genre | : |
ISBN | : 0788125214 |
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Author | : Barry N. Taylor |
Publisher | : DIANE Publishing |
Total Pages | : 25 |
Release | : 2009-11 |
Genre | : Science |
ISBN | : 1437915566 |
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Spreading Resistance Symposium
Author | : James R. Ehrstein |
Publisher | : |
Total Pages | : 300 |
Release | : 1974 |
Genre | : Technology & Engineering |
ISBN | : |
National Semiconductor Metrology Program
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 146 |
Release | : 1995 |
Genre | : Semiconductors |
ISBN | : |