Modeling Emerging Semiconductor Devices For Circuit Simulation
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Author | : Tor A. Fjeldly |
Publisher | : Wiley-Interscience |
Total Pages | : 440 |
Release | : 1998 |
Genre | : Computers |
ISBN | : |
This book is a useful reference for practicing electrical engineers as well as a textbook for a junior/senior or graduate level course in electrical engineering. The authors combine two subjects: device modeling and circuit simulation - by providing a large number of well-prepared examples of circuit simulations immediately following the description of many device models.
Author | : Giuseppe Massabrio |
Publisher | : McGraw Hill Professional |
Total Pages | : 500 |
Release | : 1998-12-22 |
Genre | : Technology & Engineering |
ISBN | : 9780071349550 |
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.
Author | : Siegfried Selberherr |
Publisher | : Springer Science & Business Media |
Total Pages | : 525 |
Release | : 2012-12-06 |
Genre | : Computers |
ISBN | : 3709166578 |
The "Fifth International Conference on Simulation of Semiconductor Devices and Processes" (SISDEP 93) continues a series of conferences which was initiated in 1984 by K. Board and D. R. J. Owen at the University College of Wales, Swansea, where it took place a second time in 1986. Its organization was succeeded by G. Baccarani and M. Rudan at the University of Bologna in 1988, and W. Fichtner and D. Aemmer at the Federal Institute of Technology in Zurich in 1991. This year the conference is held at the Technical University of Vienna, Austria, September 7 - 9, 1993. This conference shall provide an international forum for the presentation of out standing research and development results in the area of numerical process and de vice simulation. The miniaturization of today's semiconductor devices, the usage of new materials and advanced process steps in the development of new semiconduc tor technologies suggests the design of new computer programs. This trend towards more complex structures and increasingly sophisticated processes demands advanced simulators, such as fully three-dimensional tools for almost arbitrarily complicated geometries. With the increasing need for better models and improved understand ing of physical effects, the Conference on Simulation of Semiconductor Devices and Processes brings together the simulation community and the process- and device en gineers who need reliable numerical simulation tools for characterization, prediction, and development.
Author | : Roy Leventhal |
Publisher | : Springer Science & Business Media |
Total Pages | : 769 |
Release | : 2007-01-10 |
Genre | : Technology & Engineering |
ISBN | : 0387241604 |
Discusses process variation, model accuracy, design flow and many other practical engineering, reliability and manufacturing issues Gives a good overview for a person who is not an expert in modeling and simulation, enabling them to extract the necessary information to competently use modeling and simulation programs Written for engineering students and product design engineers
Author | : Narain Arora |
Publisher | : World Scientific |
Total Pages | : 633 |
Release | : 2007-02-14 |
Genre | : Technology & Engineering |
ISBN | : 9814365491 |
A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.
Author | : Kevin M. Kramer |
Publisher | : Prentice Hall |
Total Pages | : 746 |
Release | : 1997 |
Genre | : Business & Economics |
ISBN | : |
CD-ROM contains: "Win32 version of SGFramework and the simulations contains in the book."
Author | : Andreas Schenk |
Publisher | : Springer Science & Business Media |
Total Pages | : 384 |
Release | : 1998-07-07 |
Genre | : Technology & Engineering |
ISBN | : 9783211830529 |
From the reviews: "... this is a well produced book, written in a easy to read style, and will also be a very useful primer for someone starting out the field [...], and a useful source of reference for experienced users ..." Microelectronics Journal
Author | : Fabrizio Bonani |
Publisher | : Springer Science & Business Media |
Total Pages | : 241 |
Release | : 2013-03-09 |
Genre | : Technology & Engineering |
ISBN | : 3662045303 |
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
Author | : Gennady Gildenblat |
Publisher | : Springer Science & Business Media |
Total Pages | : 531 |
Release | : 2010-06-22 |
Genre | : Technology & Engineering |
ISBN | : 9048186145 |
Most of the recent texts on compact modeling are limited to a particular class of semiconductor devices and do not provide comprehensive coverage of the field. Having a single comprehensive reference for the compact models of most commonly used semiconductor devices (both active and passive) represents a significant advantage for the reader. Indeed, several kinds of semiconductor devices are routinely encountered in a single IC design or in a single modeling support group. Compact Modeling includes mostly the material that after several years of IC design applications has been found both theoretically sound and practically significant. Assigning the individual chapters to the groups responsible for the definitive work on the subject assures the highest possible degree of expertise on each of the covered models.
Author | : Weidong Liu |
Publisher | : World Scientific |
Total Pages | : 435 |
Release | : 2011 |
Genre | : Technology & Engineering |
ISBN | : 9812813993 |
This book presents the art of advanced MOSFET modeling for integrated circuit simulation and design. It provides the essential mathematical and physical analyses of all the electrical, mechanical and thermal effects in MOS transistors relevant to the operation of integrated circuits. Particular emphasis is placed on how the BSIM model evolved into the first ever industry standard SPICE MOSFET model for circuit simulation and CMOS technology development. The discussion covers the theory and methodology of how a MOSFET model, or semiconductor device models in general, can be implemented to be robust and efficient, turning device physics theory into a production-worthy SPICE simulation model. Special attention is paid to MOSFET characterization and model parameter extraction methodologies, making the book particularly useful for those interested or already engaged in work in the areas of semiconductor devices, compact modeling for SPICE simulation, and integrated circuit design.