Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV

Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
Author: Sharad Prasad
Publisher: Society of Photo Optical
Total Pages: 240
Release: 1998
Genre: Technology & Engineering
ISBN: 9780819429698

A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.

Reliability, Yield, and Stress Burn-In

Reliability, Yield, and Stress Burn-In
Author: Way Kuo
Publisher: Springer Science & Business Media
Total Pages: 407
Release: 2013-11-27
Genre: Technology & Engineering
ISBN: 1461556716

The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.