Advanced Metrology

Advanced Metrology
Author: X. Jane Jiang
Publisher: Academic Press
Total Pages: 376
Release: 2020-04-08
Genre: Technology & Engineering
ISBN: 0128218169

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Engineering Metrology and Measurements

Engineering Metrology and Measurements
Author: Raghavendra,
Publisher: OUP India
Total Pages: 0
Release: 2013-05
Genre: Technology & Engineering
ISBN: 9780198085492

Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Industrial Metrology

Industrial Metrology
Author: Graham T. Smith
Publisher: Springer Science & Business Media
Total Pages: 336
Release: 2013-04-17
Genre: Technology & Engineering
ISBN: 1447138147

The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. It has taken a long time for manufacturing engineers and designers to realise the usefulness of these features in quality of conformance and quality of design. Unfortunately this awareness has come at a time when engineers versed in the use and specification of surfaces are at a premium. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications. Such people understood the processes and the achievable accuracies of machine tools, thereby enabling them to match production capability with design requirements. This synergy, has been made possible by the understanding of adherence to careful metrological procedures and a detailed knowledge of surface measuring instruments and their operation, in addition to wider inspection room techniques. With the demise in the UK of polytechnics and technical colleges, this source of skilled technicians has all but dried up. The shortfall has been made up of semi skilled craftsmen, or inexperienced graduates who cannot be expected to satisfy tradition al or new technology needs. Miniaturisation, for example, has had a pro found effect. Engineering parts are now routinely being made with nanometre surface texture and fiatness. At these molecular and atomic scales, the engineer has to be a physicist.

Introduction to Quantum Metrology

Introduction to Quantum Metrology
Author: Waldemar Nawrocki
Publisher: Springer
Total Pages: 287
Release: 2015-03-24
Genre: Technology & Engineering
ISBN: 3319156691

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

Metrology in Chemistry

Metrology in Chemistry
Author: Ewa Bulska
Publisher: Springer
Total Pages: 201
Release: 2018-09-29
Genre: Science
ISBN: 3319992066

In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.

Introduction to Statistics in Metrology

Introduction to Statistics in Metrology
Author: Stephen Crowder
Publisher: Springer Nature
Total Pages: 357
Release: 2020-11-30
Genre: Mathematics
ISBN: 3030533298

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.

Metrology in Urban Drainage and Stormwater Management

Metrology in Urban Drainage and Stormwater Management
Author: Jean-Luc Bertrand-Krajewski
Publisher:
Total Pages:
Release: 2021
Genre:
ISBN:

This book presents the advancements made in applied metrology in the field of Urban Drainage and Storm water Management over the past two decades in scientific research as well as in practical applications. Given the broadness of this subject (measuring principles, uncertainty in data, data validation, data storage and communication, design, maintenance and management of monitoring networks, technical details of sensor technology), the focus is on water quantity and a sound metrological basis. The book offers common ground for academics and practitioners when setting up monitoring projects in urban drainage and storm water management. This will enable an easier exchange of results so as to allow for a faster scientific progress in the field. A second, but equally important goal, is to allow practitioners access to scientific developments and gained experience when it comes to monitoring urban drainage and storm water systems. In-depth descriptions of international case studies covering all aspects discussed in the book are presented, along with self-training exercises and codes available for readers on a companion website.

Quantum Metrology

Quantum Metrology
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
Total Pages: 243
Release: 2015-09-21
Genre: Science
ISBN: 3527412654

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

Springer Handbook of Metrology and Testing

Springer Handbook of Metrology and Testing
Author: Horst Czichos
Publisher: Springer Science & Business Media
Total Pages: 1244
Release: 2011-07-22
Genre: Technology & Engineering
ISBN: 3642166415

This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.

Optical Metrology

Optical Metrology
Author: Kjell J. Gåsvik
Publisher: John Wiley & Sons
Total Pages: 372
Release: 2003-04-11
Genre: Technology & Engineering
ISBN: 0470846704

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.