Mass Metrology
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Author | : S. V. Gupta |
Publisher | : Springer Science & Business Media |
Total Pages | : 365 |
Release | : 2012-01-26 |
Genre | : Technology & Engineering |
ISBN | : 3642234127 |
This book presents the practical aspects of mass measurements. Concepts of gravitational, inertial and conventional mass and details of the variation of acceleration of gravity are described. The Metric Convention and International Prototype Kilogram and BIPM standards are described. The effect of change of gravity on the indication of electronic balances is derived with respect of latitude, altitude and earth topography. The classification of weights by OIML is discussed. Maximum permissible errors in different categories of weights prescribed by national and international organizations are presented. Starting with the necessity of redefining the unit kilogram in terms of physical constants, various methods of defining the kilogram in terms of physical constants are described. The kilogram can be defined by Avogadro’s constant, ion collection of some heavy elements, levitation, voltage and Watt Balance. The detection of very small mass of the order of zeptogram through Nanotechnolgy is also discussed. Latest recommendations of CIPM are given.
Author | : K. B. Jaeger |
Publisher | : |
Total Pages | : 96 |
Release | : 1984 |
Genre | : Mass (Physics) |
ISBN | : |
Author | : Manfred Kochsiek |
Publisher | : Wiley-VCH |
Total Pages | : 572 |
Release | : 2000-02-22 |
Genre | : Business & Economics |
ISBN | : |
M. Kochsiek, M. Glaser (eds.) Comprehensive Mass Metrology Mass determination is of fundamental importance for science, technology and economics. Technical measuring systems range from ultramicro balances to weighing machines for freight trains; massive objects range from subatomic particles to galaxies. Comprehensive and topical, this reference work -- edited by scientists of the Physikalisch-Technische Bundesanstalt, Germany -- covers the whole field of mass determination. Starting from physical foundations, it describes virtually all measurement techniques in detail and gives a thorough overview over scientific experiments related to the determination of masses. Reports on contemporary problems, such as a new definition of the kilogram, historical excursions and a list of references without competition make this book an absolute must for everyone dealing with questions relating to mass determination in fundamental research, technical application, calibration service, and standardization. From the contents: - Mass as a Physical Quantity - The Determination of Mass - Mass Comparators - Quantities Derived from Mass and their Determination
Author | : Theo W. Hänsch |
Publisher | : IOS Press |
Total Pages | : 683 |
Release | : 2007 |
Genre | : Computers |
ISBN | : 1586037846 |
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Author | : Frank E. Jones |
Publisher | : CRC Press |
Total Pages | : 334 |
Release | : 2002-03-26 |
Genre | : Mathematics |
ISBN | : 1420038451 |
"How much does it weigh?" seems a simple question. To scientists and engineers, however, the answer is far from simple, and determining the answer demands consideration of an almost overwhelming number of factors. With an intriguing blend of history, fundamentals, and technical details, the Handbook of Mass Measurement sets forth the details
Author | : T.J. Quinn |
Publisher | : IOS Press |
Total Pages | : 836 |
Release | : 2001-12-18 |
Genre | : Science |
ISBN | : 1614990026 |
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.
Author | : M.J.T. Milton |
Publisher | : IOS Press |
Total Pages | : 480 |
Release | : 2021-12-22 |
Genre | : Science |
ISBN | : 1643682474 |
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular. This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course. Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.
Author | : A. Di Giuseppe |
Publisher | : IOS Press |
Total Pages | : 567 |
Release | : 2013-10-21 |
Genre | : Science |
ISBN | : 1614993262 |
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Author | : Tom Proulx |
Publisher | : Springer Science & Business Media |
Total Pages | : 272 |
Release | : 2011-03-24 |
Genre | : Technology & Engineering |
ISBN | : 1441988254 |
This the second volume of six from the Annual Conference of the Society for Experimental Mechanics, 2010, brings together 40 chapters on Microelectromechanical Systems and Nanotechnology. It presents early findings from experimental and computational investigations on MEMS and Nanotechnology including contributions on Nanomechanical Standards, Magneto-mechanical MEMS Sensors, Piezoelectric MEMS for Energy Harvesting, and Linear and Nonlinear Mass Sensing.
Author | : Jeffrey H Williams |
Publisher | : Morgan & Claypool Publishers |
Total Pages | : 169 |
Release | : 2016-11-01 |
Genre | : Science |
ISBN | : 1681744341 |
Measurements and experiments are made each and every day, in fields as disparate as particle physics, chemistry, economics and medicine, but have you ever wondered why it is that a particular experiment has been designed to be the way it is. Indeed, how do you design an experiment to measure something whose value is unknown, and what should your considerations be on deciding whether an experiment has yielded the sought after, or indeed any useful result? These are old questions, and they are the reason behind this volume. We will explore the origins of the methods of data analysis that are today routinely applied to all measurements, but which were unknown before the mid-19th Century. Anyone who is interested in the relationship between the precision and accuracy of measurements will find this volume useful. Whether you are a physicist, a chemist, a social scientist, or a student studying one of these subjects, you will discover that the basis of measurement is the struggle to identify the needle of useful data hidden in the haystack of obscuring background noise.