ISTFA 2010

ISTFA 2010
Author:
Publisher: ASM International
Total Pages: 487
Release: 2010-01-01
Genre: Technology & Engineering
ISBN: 1615037276

ISTFA 2009

ISTFA 2009
Author:
Publisher: ASM International
Total Pages: 371
Release: 2009-01-01
Genre: Technology & Engineering
ISBN: 1615030921

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

ISTFA 2011

ISTFA 2011
Author:
Publisher: ASM International
Total Pages: 479
Release: 2011
Genre: Technology & Engineering
ISBN: 1615038507

Istfa 2003

Istfa 2003
Author: ASM International
Publisher: ASM International
Total Pages: 534
Release: 2003-01-01
Genre: Technology & Engineering
ISBN: 1615030867

ISTFA 2012

ISTFA 2012
Author: ASM International
Publisher: ASM International
Total Pages: 643
Release: 2012
Genre: Technology & Engineering
ISBN: 1615039953

ISTFA 2014

ISTFA 2014
Author: A. S. M. International
Publisher: ASM International
Total Pages: 561
Release: 2014-11-01
Genre: Technology & Engineering
ISBN: 1627080740

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.

ISTFA 2013

ISTFA 2013
Author: A. S. M. International
Publisher: ASM International
Total Pages: 634
Release: 2013-01-01
Genre: Technology & Engineering
ISBN: 1627080228

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Total Pages: 593
Release: 2018-12-01
Genre: Technology & Engineering
ISBN: 1627080996

The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Total Pages: 540
Release: 2019-12-01
Genre: Technology & Engineering
ISBN: 1627082735

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.