Internal Electrostatic Transduction of Micromechanical Resonators

Internal Electrostatic Transduction of Micromechanical Resonators
Author: Maryam Ziaei-Moayyed
Publisher:
Total Pages:
Release: 2009
Genre:
ISBN:

Micromechanical signal processors have a great potential to revolutionize the wireless system architectures by offering a pathway toward full system integration, miniaturization, and lower power consumption. Laterally driven electrostatic micromechanical resonators with high quality factors and frequencies beyond 1GHz have been previously demonstrated. One of the major challenges in the integration of electrostatic MEMS resonators with integrated circuits has been their high motional resistance. Internal electrostatic transduction is introduced as a solution to achieve micromechanical resonators in the radio and microwave frequencies, with low motional resistances, and high quality factors in air. A manufacturable double nanogap process introduced in this thesis allows for fabrication of many high aspect-ratio nano-scale dielectric "gaps" within a single resonator using a combination of lithography and dielectric deposition. Quartz is introduced as a desirable substrate for MEMS resonators, allowing for direct two-port measurements at RF and microwave frequencies. Higher-order mode internally transduced ring resonators are designed, fabricated, and tested in this work. A fifth order dielectrically transduced ring resonator at 1.95GHz is measured on a quartz substrate using direct two-port transmission measurement. The proper placement of dielectric within the resonating structure allowed for a Q of greater than 9000 in air. The concept of serpentine internal electrostatic transduction is introduced, which allows for many capacitances to be transduced in parallel, resulting in a lower motional resistance. The 41st radial bulk mode of a two-port serpentine ring resonator was demonstrated at 2.74 GHz, with a quality factor of 7000 in air. This resonator has a high f x Q product of 1.93x1013, with a low motional resistance of less than 500W. This is the highest f x Q product demonstrated for a polysilicon MEMS resonator in air. This resonator also exhibited the lowest motional resistance demonstrated for an electrostatic polysilicon MEMS resonator in the GHz frequency range. These results demonstrate that internal electrostatic transduction is suitable for the efficient, selective excitation of higher-order lateral bulk modes in resonators. The concept of parallel internal electrostatic transduction is introduced, where a Lamé-mode resonator with integrated electrodes was designed, fabricated, and tested successfully. The integrated electrodes were placed within the resonating plate to efficiently couple to the Lamé mode of resonance, which allows for a fully differential drive/sense scheme. This measurement method allows for lower ohmic losses and helps to suppress the feedthrough significantly. This resonator demonstrated a high quality factor of> 12000 in air at 128.15MHz. Such a high quality factor makes this resonator attractive for different applications. These results validate internal electrostatic transduction of bulk-mode resonators as a viable method for efficient transduction of MEMS resonators in RF and microwave regime. The resonators in this thesis demonstrate the capacity of internal electrostatic transduction to achieve high quality factor, high frequency microresonators with low motional resistance that can be integrated with CMOS technology to achieve fully integrated communication systems.

Magnetic Transduction for RF Micromechanical Filters

Magnetic Transduction for RF Micromechanical Filters
Author: Sepehr Forouzanfar
Publisher:
Total Pages: 109
Release: 2012
Genre:
ISBN:

The use of electrostatic transduction has enabled high-Q miniaturized mechanical resonators made of non-piezoelectric material that vibrate at high and ultra high frequencies. However, this transduction technique suffers from large values of motional resistance associated with the technique, limiting its use for interfacing to standard 50 RF circuits. Piezoelectric transduction has advantages over the electrostatic method because of its comparable to 50 motional resistance. However, the technique requires use of thin film piezoelectric materials with the demonstrated Qs that are much lower than their corresponding non-piezoelectric resonators. This research proposes use of electrodynamic transduction, reports analytic and experimental studies on electrodynamic transduction for RF application, highlights the method's advantages, and lists the contributions. The use of Lorentz-force transduction for RF micromechanical filters proposed in this work is pursued by experimentally evaluating the transduction technique implemented for microfabricated designs. By fabricating single and coupled microresonators in a few different fabrication technologies, including CMOS35, the performance of the Lorentz-force driven microresonators is studied. Using a laser vibrometer, the actual performance, including the displacement and velocity of the moving points of the microstructures' surfaces, are measured. The mode shapes and resonance specifications of the microstructures in air and vacuum derived by laser vibrometer provide data for characterizing the employed Lorentz-force transduction technique. Furthermore, the results from the electrical measurements are compared to the micromechanical resonators' frequency response obtained from the mechanical measurements by laser vibrometer. The significantly low values of motional resistance computed for the differently fabricated designs demonstrate the advantage of Lorentz-force transduction for RF filter applications. Should a device similar in size be driven electrostatically, the motional resistance would be multiple orders of magnitude higher. This research reports the experimental results obtained by examining a Lorentz- force transduction application for developing RF micromechanical filters. The results demonstrate the Lorentz-force transduction's advantages over other transduction methods used for RF [mu]-mechanical filters. Compared to electrostatic transduction, the Lorentz-force method provides greater electromechanical coupling, multiple orders of magnitude lower motional resistance, the independence of the filter center frequency from the bias voltage, higher power handling, and no requirement for bias lines, which decreases the work in microfabrication. Unlike piezoelectric transduction, the electrodynamic technique requires no piezoelectric material. Use of non-piezoelectric materials provides more flexibility for resonator material in the IC-compatible fabrications. Power handling in electrodynamic transduction has fewer limitations than other transduction techniques because the higher power needed in electrostatic or piezoelectric methods requires a higher voltage, which is limited by the breakdown voltage. The higher power in Lorentz-force-based transduction demands a larger current. The larger current produces heat that is removable by applying an appropriate cooling technique.

The Resonant Junction Transistor

The Resonant Junction Transistor
Author: Eugene Oh Hwang
Publisher:
Total Pages: 194
Release: 2012
Genre:
ISBN:

Vibrating RF MEMS resonators have emerged as a potential solution for implementing monolithically integrated filters and frequency references for applications that require extreme scaling of size and weight. Electrostatically transduced resonators in particular have received attention as on-chip stable high frequency references due to their compatibility with existing CMOS processes and high quality factor (Q) often exceeding 10,000. Many of these electrostatic resonators, however, use extremely small air-gaps, which pose significant reliability problems, or use very thick device layer (> 10 [mu]m) silicon-on-insulator (SOI) substrates, which require significant changes to existing SOI CMOS processes and significantly increases cost. This dissertation presents a novel transduction mechanism using the depletion forces in pn-diodes to achieve efficient transduction at frequencies exceeding 1 GHz without sacrificing Q, fabricated in a process that can be completely integrated into a typical SOI RF CMOS front end process flow without any significant changes. This dissertation presents the theory of actuation and sensing, fabrication process, and experimental results for these pn-diode internally transduced RF MEMS resonators fabricated in the Cornell Nanoscale Science and Technology Facility (CNF). Measurements were performed using a pseudo-differential setup to demonstrate the feasibility of using such devices in conjunction with simple interfacing electronics. Experimental results indicate Q = 18,000 at a resonant frequency of 3.72 GHz, yielding the highest reported electrically measured room temperature f-Q product in silicon to date of 6.69x1013 Hz. The high Q of these devices - approaching the material limit in silicon - can be attributed in part to the simple transducer using only a homogeneous doped singlecrystal silicon structure. Such devices might therefore be useful for investigating the intrinsic acoustic loss mechanisms not only in silicon, but also in any other semiconducting material whose electrical properties can be controlled by doping. In this dissertation, we use these devices to present the first experimental verification of Landau-Rumer phonon-phonon scattering in single-crystal silicon at gigahertz frequencies via temperature measurements. In addition, data presented in this dissertation at low temperatures below 50 K indicates that electron-phonon scattering may play a greater role in limiting the Q of gigahertz silicon mechanical resonators than previously believed. While pseudo-differential measurements were able to yield a distinct second-order transmission response, the need for a differential environment may be a limitation for certain systems where a single-ended architecture is necessary, especially for ultra low-power or portable applications. To solve this problem, we make use of the piezoresistive property of single-crystal silicon (i.e., change in resistivity due to elastic strain) to sense the output motional current. This sensing mechanism eliminates the direct feedthrough path from input to output formed by the static capacitance of the transducers and allows for electrical detection of the mechanical resonance using a simple two-port RF measurement setup. In this dissertation, we employ a variation of the presented pn-diode transduced RF MEMS resonator which uses piezoresistive sensing through the lightly doped channel in an embedded junction field effect transistor (JFET) - the resonant junction transistor. Using this device, we demonstrate a micromechanical resonator with Q = 25,900 at a resonant frequency of 1.61 GHz. The frequency selective acoustic transconductance induced via the piezoresistive effect is 171 [mu]S for a drain current of 143 [mu]A, yielding an acoustic transconductance to bias current ratio (ga/ID) of 1.2 V-1. When integrated with SOI RF CMOS transistors that can provide power gain at the resonant frequency, this value puts this device in the realm of practicality for monolithic, direct synthesis of high-frequency local oscillator (LO) signals for low-power transceivers.

Piezoelectrically-transduced Silicon Micromechanical Resonators

Piezoelectrically-transduced Silicon Micromechanical Resonators
Author: Abhishek Sivapurapu
Publisher:
Total Pages:
Release: 2005
Genre: Microelectromechanical systems
ISBN:

This thesis reports on the design and fabrication of micro-electro-mechanical (MEM) resonators on silicon that are piezoelectrically-transduced for operation in the very high frequency (VHF) range. These devices have a block-type or beam-type design, and are designed to resonate in their in-plane and out-of-plane bulk extensional modes. Two piezoelectric materials were taken into consideration, zinc-oxide (ZnO) and lead-zirconate-titanate (PZT). The resonators are fabricated on silicon-on-insulator (SOI) wafers and the metal/piezo/metal stack of layers forming the device is built and patterned on the device layer silicon via photolithography techniques, RF sputtering (for the piezo-layer) and electron-beam evaporation (for the metal layers). The designing aspect involved ANSYS simulations of the mode-shapes and estimation of frequencies, and these have correlated well with experimental results. Devices with RF sputtered ZnO were successfully fabricated and tested to give high quality factors at reasonably high frequencies. A gold ground plane was implemented to reduce the feed-through level and increase the signal-to-noise ratio. Extensive characterization of PZT was also done as a replacement for ZnO, as the former material has a much higher piezoelectric coefficient and can therefore extend the operation of these MEM resonators into the UHF range. Although the basic design of the device remains the same, incorporation of PZT complicates the process flow considerably with respect to the chemistry now involved with the patterning of different layers. The frequency response for ZnO-based resonators as well as all the characterization data for PZT has been reported.

MEMS Mechanical Sensors

MEMS Mechanical Sensors
Author: Stephen Beeby
Publisher: Artech House
Total Pages: 282
Release: 2004
Genre: Technology & Engineering
ISBN: 9781580538732

Annotation Engineers and researchers can turn to this reference time and time again when they need to overcome challenges in design, simulation, fabrication, and application of MEMS (microelectromechanical systems) sensors.