Interferometry For Precision Measurement
Download Interferometry For Precision Measurement full books in PDF, epub, and Kindle. Read online free Interferometry For Precision Measurement ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : Peter Langenbeck |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 243 |
Release | : 2014 |
Genre | : Science |
ISBN | : 9780819491404 |
Interferometry can be seen as the stethoscope of the precision optical engineer. This book presents various interferometric developments used in physical, optical, and mechanical engineering during the past half century. It is an expanded translation of one chapter of the German Wirtschaftliche Mikrobearbeitung, also by Langenbeck, published by Carl Hanser Verlag, Munich-Vienna, in 2009. The book is illustrated with many practical examples and photographs that are a direct consequence of the author’s vast experience in the subject. The author provides some little-known testing techniques that could lead to future innovation in interferometric testing, along with occasional ""Notes for the practitioner,"" which give the reader tips for successful implementation of the author’s repertoire of techniques. The text will be of value to anyone interested in learning about interferometric evaluation of small mechanical and optical components.
Author | : D.C. Williams |
Publisher | : Springer Science & Business Media |
Total Pages | : 490 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 9401115648 |
Optical methods, stimulated by the advent of inexpensive and reliable lasers, are assuming an increasingly important role in the field of engineering metrology. Requiring only a basic knowledge of optics, this text provides a compendium of practical information prepared by leaders in the field.
Author | : G.M. Tino |
Publisher | : IOS Press |
Total Pages | : 807 |
Release | : 2014-10-16 |
Genre | : Science |
ISBN | : 161499448X |
Since atom interferometers were first realized about 20 years ago, atom interferometry has had many applications in basic and applied science, and has been used to measure gravity acceleration, rotations and fundamental physical quantities with unprecedented precision. Future applications range from tests of general relativity to the development of next-generation inertial navigation systems. This book presents the lectures and notes from the Enrico Fermi school "Atom Interferometry", held in Varenna, Italy, in July 2013. The aim of the school was to cover basic experimental and theoretical aspects and to provide an updated review of current activities in the field as well as main achievements, open issues and future prospects. Topics covered include theoretical background and experimental schemes for atom interferometry; ultracold atoms and atom optics; comparison of atom, light, electron and neutron interferometers and their applications; high precision measurements with atom interferometry and their application to tests of fundamental physics, gravitation, inertial measurements and geophysics; measurement of fundamental constants; interferometry with quantum degenerate gases; matter wave interferometry beyond classical limits; large area interferometers; atom interferometry on chips; and interferometry with molecules. The book will be a valuable source of reference for students, newcomers and experts in the field of atom interferometry.
Author | : P. Hariharan |
Publisher | : Academic Press |
Total Pages | : 232 |
Release | : 2012-12-02 |
Genre | : Technology & Engineering |
ISBN | : 0080918611 |
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Author | : P. Hariharan |
Publisher | : Academic Press |
Total Pages | : 369 |
Release | : 2003-09-22 |
Genre | : Science |
ISBN | : 0123116309 |
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Author | : Paul R. Berman |
Publisher | : Academic Press |
Total Pages | : 497 |
Release | : 1997-01-08 |
Genre | : Science |
ISBN | : 008052768X |
The field of atom interferometry has expanded rapidly in recent years, and todays research laboratories are using atom interferometers both as inertial sensors and for precision measurements. Many researchers also use atom interferometry as a means of researching fundamental questions in quantum mechanics. Atom Interferometry contains contributions from theoretical and experimental physicists at the forefront of this rapidly developing field. Editor Paul R. Berman includes an excellent balance of background material and recent experimental results,providing a general overview of atom interferometry and demonstrating the promise that it holds for the future. - Includes contributions from many of the research groups that have pioneered this emerging field - Discusses and demonstrates new aspects of the wave nature of atoms - Explains the many important applications of atom interferometry, from a measurement of the gravitational constant to atom lithography - Examines applications of atom interferometry to fundamentally important quantum mechanics problems
Author | : Jonathan D. Ellis |
Publisher | : SPIE-International Society for Optical Engineering |
Total Pages | : 0 |
Release | : 2014 |
Genre | : Science |
ISBN | : 9780819497994 |
Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Author | : |
Publisher | : |
Total Pages | : 974 |
Release | : 1961 |
Genre | : Physical measurements |
ISBN | : |
Author | : Gregory Harry |
Publisher | : Cambridge University Press |
Total Pages | : 343 |
Release | : 2012-01-12 |
Genre | : Science |
ISBN | : 1139504681 |
Thermal noise from optical coatings is a growing area of concern and overcoming limits to the sensitivity of high precision measurements by thermal noise is one of the greatest challenges faced by experimental physicists. In this timely book, internationally renowned scientists and engineers examine our current theoretical and experimental understanding. Beginning with the theory of thermal noise in mirrors and substrates, subsequent chapters discuss the technology of depositing coatings and state-of-the-art dielectric coating techniques used in precision measurement. Applications and remedies for noise reduction are also covered. Individual chapters are dedicated to specific fields where coating thermal noise is a particular concern, including the areas of quantum optics/optomechanics, gravitational wave detection, precision timing, high-precision laser stabilisation via optical cavities and cavity quantum electrodynamics. While providing full mathematical detail, the text avoids field-specific jargon, making it a valuable resource for readers with varied backgrounds in modern optics.
Author | : Dahi Ghareab Abdelsalam Ibrahim |
Publisher | : Cambridge Scholars Publishing |
Total Pages | : 312 |
Release | : 2019-07-31 |
Genre | : Technology & Engineering |
ISBN | : 1527537730 |
The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.