Integrated Circuit Failure Analysis
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Author | : Friedrich Beck |
Publisher | : John Wiley & Sons |
Total Pages | : 198 |
Release | : 1998-02-04 |
Genre | : Technology & Engineering |
ISBN | : 9780471974017 |
Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.
Author | : Lawrence C. Wagner |
Publisher | : Springer Science & Business Media |
Total Pages | : 256 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461549191 |
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Author | : Karel Maria André Van Doorselaer |
Publisher | : |
Total Pages | : 202 |
Release | : 1994 |
Genre | : |
ISBN | : 9789090071237 |
Author | : Z. Jamal |
Publisher | : |
Total Pages | : |
Release | : 2005 |
Genre | : |
ISBN | : |
Author | : Charles Cohn |
Publisher | : McGraw Hill Professional |
Total Pages | : 394 |
Release | : 2005 |
Genre | : Technology & Engineering |
ISBN | : 9780071434843 |
The shrinking of integrated circuits (ICs) puts tremendous stress on overall device reliability. This unique treatment uses graphic illustration to clearly identify all major failure mode types, so engineers can spot failures before they occur.
Author | : |
Publisher | : ASM International |
Total Pages | : 813 |
Release | : 2004-01-01 |
Genre | : Technology & Engineering |
ISBN | : 0871708043 |
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Author | : C. W. Scott |
Publisher | : |
Total Pages | : 168 |
Release | : 1970 |
Genre | : |
ISBN | : |
The report describes experience in determining the actual reliability of Minuteman integrated circuits. The device constructions and evolution are discussed in terms of the materials, design, testing, and failure analysis of these circuits. System failures are shown to occur because of either improper device designs or inefficient inspections and testing. (Author).
Author | : Tejinder Gandhi |
Publisher | : ASM International |
Total Pages | : 750 |
Release | : 2019-11-01 |
Genre | : Technology & Engineering |
ISBN | : 1627082468 |
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author | : EDFAS Desk Reference Committee |
Publisher | : ASM International |
Total Pages | : 673 |
Release | : 2011 |
Genre | : Technology & Engineering |
ISBN | : 1615037268 |
Includes bibliographical references and index.
Author | : |
Publisher | : |
Total Pages | : 378 |
Release | : 2005 |
Genre | : Integrated circuits |
ISBN | : |