Industrial Applications Of Electron Microscopy
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Author | : Zhigang Li |
Publisher | : CRC Press |
Total Pages | : 656 |
Release | : 2002-12-04 |
Genre | : Science |
ISBN | : 9780203910306 |
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries
Author | : Ray Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 224 |
Release | : 2011-02-11 |
Genre | : Technology & Engineering |
ISBN | : 9780387258003 |
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author | : Zhigang Li |
Publisher | : CRC Press |
Total Pages | : 640 |
Release | : 2002-12-04 |
Genre | : Science |
ISBN | : 0824745760 |
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Author | : Ludwig Reimer |
Publisher | : SPIE Press |
Total Pages | : 162 |
Release | : 1993 |
Genre | : Science |
ISBN | : 9780819412065 |
While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
Author | : Alina Bruma |
Publisher | : CRC Press |
Total Pages | : 162 |
Release | : 2020-12-22 |
Genre | : Technology & Engineering |
ISBN | : 0429516169 |
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Author | : Frances M. Ross |
Publisher | : Cambridge University Press |
Total Pages | : 529 |
Release | : 2017 |
Genre | : Science |
ISBN | : 1107116570 |
2.6.2 Electrodes for Electrochemistry
Author | : Weilie Zhou |
Publisher | : Springer Science & Business Media |
Total Pages | : 533 |
Release | : 2007-03-09 |
Genre | : Technology & Engineering |
ISBN | : 0387396209 |
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author | : Frank Smith |
Publisher | : CRC Press |
Total Pages | : 1012 |
Release | : 1999-09-22 |
Genre | : Science |
ISBN | : 1482276119 |
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major
Author | : Jürgen Thomas |
Publisher | : Springer Science & Business |
Total Pages | : 357 |
Release | : 2014-04-17 |
Genre | : Technology & Engineering |
ISBN | : 9401786011 |
This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.
Author | : Frank Smith |
Publisher | : CRC Press |
Total Pages | : 1026 |
Release | : 1999-09-22 |
Genre | : Science |
ISBN | : 0824719921 |
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.