Industrial Applications Of Electron Microscopy

Industrial Applications Of Electron Microscopy
Author: Zhigang Li
Publisher: CRC Press
Total Pages: 656
Release: 2002-12-04
Genre: Science
ISBN: 9780203910306

Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries

Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Industrial Applications Of Electron Microscopy

Industrial Applications Of Electron Microscopy
Author: Zhigang Li
Publisher: CRC Press
Total Pages: 640
Release: 2002-12-04
Genre: Science
ISBN: 0824745760

Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.

Image Formation in Low-voltage Scanning Electron Microscopy

Image Formation in Low-voltage Scanning Electron Microscopy
Author: Ludwig Reimer
Publisher: SPIE Press
Total Pages: 162
Release: 1993
Genre: Science
ISBN: 9780819412065

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.

Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy
Author: Alina Bruma
Publisher: CRC Press
Total Pages: 162
Release: 2020-12-22
Genre: Technology & Engineering
ISBN: 0429516169

Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Liquid Cell Electron Microscopy

Liquid Cell Electron Microscopy
Author: Frances M. Ross
Publisher: Cambridge University Press
Total Pages: 529
Release: 2017
Genre: Science
ISBN: 1107116570

2.6.2 Electrodes for Electrochemistry

Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology
Author: Weilie Zhou
Publisher: Springer Science & Business Media
Total Pages: 533
Release: 2007-03-09
Genre: Technology & Engineering
ISBN: 0387396209

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Industrial Applications of X-Ray Diffraction

Industrial Applications of X-Ray Diffraction
Author: Frank Smith
Publisher: CRC Press
Total Pages: 1012
Release: 1999-09-22
Genre: Science
ISBN: 1482276119

By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major

Analytical Transmission Electron Microscopy

Analytical Transmission Electron Microscopy
Author: Jürgen Thomas
Publisher: Springer Science & Business
Total Pages: 357
Release: 2014-04-17
Genre: Technology & Engineering
ISBN: 9401786011

This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.

Industrial Applications of X-Ray Diffraction

Industrial Applications of X-Ray Diffraction
Author: Frank Smith
Publisher: CRC Press
Total Pages: 1026
Release: 1999-09-22
Genre: Science
ISBN: 0824719921

By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.