In Situ Electron Microscopy At High Resolution
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Author | : Florian Banhart |
Publisher | : World Scientific |
Total Pages | : 318 |
Release | : 2008 |
Genre | : Science |
ISBN | : 9812797335 |
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author | : Frances M. Ross |
Publisher | : Cambridge University Press |
Total Pages | : 529 |
Release | : 2017 |
Genre | : Science |
ISBN | : 1107116570 |
2.6.2 Electrodes for Electrochemistry
Author | : Gerhard Dehm |
Publisher | : John Wiley & Sons |
Total Pages | : 403 |
Release | : 2012-05-30 |
Genre | : Technology & Engineering |
ISBN | : 3527652183 |
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Author | : John C. H. Spence |
Publisher | : Oxford University Press |
Total Pages | : 425 |
Release | : 2009 |
Genre | : Science |
ISBN | : 0199552754 |
This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Author | : Goerg H. Michler |
Publisher | : Springer Science & Business Media |
Total Pages | : 472 |
Release | : 2008-07-05 |
Genre | : Technology & Engineering |
ISBN | : 3540363521 |
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Author | : Hiroshi Fujita |
Publisher | : |
Total Pages | : 576 |
Release | : 1985 |
Genre | : Crystals |
ISBN | : |
Author | : Michael Andrew Parker |
Publisher | : |
Total Pages | : 1032 |
Release | : 1988 |
Genre | : |
ISBN | : |
Author | : Nan Yao |
Publisher | : Springer Science & Business Media |
Total Pages | : 745 |
Release | : 2006-07-12 |
Genre | : Technology & Engineering |
ISBN | : 1402080069 |
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Author | : Gerhard Dehm |
Publisher | : John Wiley & Sons |
Total Pages | : 403 |
Release | : 2012-05-29 |
Genre | : Technology & Engineering |
ISBN | : 3527319735 |
Von den Grundlagen über das Experiment bis zur Anwendung zeigt dieses Buch, wie sich Ionenstrahlanlagen, Rasterelektronenmikroskope und Transmissionselektronenmikroskope zur Beobachtung von Phänomenen bis hinunter zum Nanomaßstab in Echtzeit einsetzen lassen. Nach einem theoretischen Überblick werden experimentelle Verfahren zur Untersuchung von Aufwachsprozessen, Schmelzen, chemischen Reaktionen und Dotierung besprochen; außerdem geht es um die Messung mechanischer, magnetischer, optischer und elektronischer Kenndaten. Der letzte Abschnitt widmet sich Fragen der Soft-Matter-Charakterisierung.
Author | : Renu Sharma |
Publisher | : |
Total Pages | : 250 |
Release | : 1996-08-26 |
Genre | : Science |
ISBN | : |
Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy