In-line Methods and Monitors for Process and Yield Improvement

In-line Methods and Monitors for Process and Yield Improvement
Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 352
Release: 1999
Genre: Science
ISBN:

These conference proceedings consist of 47 papers addressing a variety of issues concerning in-line methods and monitors for process and yield improvement.

Ultraclean Surface Processing of Silicon Wafers

Ultraclean Surface Processing of Silicon Wafers
Author: Takeshi Hattori
Publisher: Springer Science & Business Media
Total Pages: 634
Release: 2013-03-09
Genre: Technology & Engineering
ISBN: 3662035359

A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.

SPE/ANTEC 2000 Proceedings

SPE/ANTEC 2000 Proceedings
Author: Spe
Publisher: CRC Press
Total Pages: 1214
Release: 2000-05-05
Genre: Technology & Engineering
ISBN: 9781566768559

Volume 2 of the conference proceedings of the SPE/Antac on 'Materials', held on the 711 May 2000 in Orlando, Florida, USA.

Handbook of Thin Film Deposition Techniques Principles, Methods, Equipment and Applications, Second Editon

Handbook of Thin Film Deposition Techniques Principles, Methods, Equipment and Applications, Second Editon
Author: Krishna Seshan
Publisher: CRC Press
Total Pages: 72
Release: 2002-02-01
Genre: Science
ISBN: 1482269686

The Handbook of Thin Film Deposition Techniques: Principles, Methods, Equipment and Applications, Second Edition explores the technology behind the spectacular growth in the silicon semiconductor industry and the continued trend in miniaturization over the last 20 years. This growth has been fueled in large part by improved thin film deposition tec

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

In-line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II
Author: Sergio Ajuria
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 258
Release: 1998
Genre: Computers
ISBN:

A collection of papers on in-line characterization techniques for performance and yield enhancement in microelectronic manufacturing. They cover: electrical/field emission techniques; optical and em-wave techniques; and surface photovoltage techniques.