Image Processing of Edge and Surface Defects

Image Processing of Edge and Surface Defects
Author: Roman Louban
Publisher: Springer Science & Business Media
Total Pages: 174
Release: 2009-09-16
Genre: Technology & Engineering
ISBN: 3642006833

The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.

Defect Recognition and Image Processing in Semiconductors 1997

Defect Recognition and Image Processing in Semiconductors 1997
Author: J. Doneker
Publisher: Routledge
Total Pages: 552
Release: 2017-11-22
Genre: Science
ISBN: 1351456466

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Image Processing of Edge and Surface Defects

Image Processing of Edge and Surface Defects
Author: Roman Louban
Publisher: Springer
Total Pages: 168
Release: 2010-04-29
Genre: Technology & Engineering
ISBN: 9783642007590

The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.

Review of Progress in Quantitative Nondestructive Evaluation

Review of Progress in Quantitative Nondestructive Evaluation
Author: Donald O. Thompson
Publisher: Springer Science & Business Media
Total Pages: 2348
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461303834

These Proceedings, consisting of Parts A and B, contain the edited versions of most of the papers presented at the annual Review of Progress in Quantitative Nondestructive Evaluation held at the University of Washington, Seattle on July 30 to August 4, 1995. The Review was organized by the Center for NDE at Iowa State University, in cooperation with the Ames Laboratory of the USDOE, the American Society of Nondestructive Testing, the Department of Energy, the National Institute of Standards and Technology, the Federal Aviation Administration, the National Science Foundation IndustryiUniversity Cooperative Research Centers, and the Working Group in Quantitative NDE. This year's Review of Progress in QNDE was attended by approximately 450 participants from the US and many foreign countries who presented over 375 papers. The meeting was divided into 36 sessions with as many as four sessions running concurrently. The Review covered all phases of NDE research and development from fundamental investigations to engineering applications or inspection systems, and it included many important methods of inspection science from acoustics to x-rays. In the last several years, the Review has stabilized at about its current size. Most participants seem to agree it is large enough to permit a full-scale overview of the latest developments but still small enough to retain the collegial atmosphere which has marked the Review since its inception. The Proceedings are structured in a format to reflect the organization of the Review itself, producing a more logical organization for both the meeting and the present volume.

Proceedings of the 3rd International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) 2017

Proceedings of the 3rd International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) 2017
Author: Limin Jia
Publisher: Springer
Total Pages: 995
Release: 2018-03-29
Genre: Technology & Engineering
ISBN: 9811079897

The proceedings collect the latest research trends, methods and experimental results in the field of electrical and information technologies for rail transportation. The topics cover novel traction drive technologies of rail transportation, safety technology of rail transportation system, rail transportation information technology, rail transportation operational management technology, rail transportation cutting-edge theory and technology etc. The proceedings can be a valuable reference work for researchers and graduate students working in rail transportation, electrical engineering and information technologies.

Surface Analysis with STM and AFM

Surface Analysis with STM and AFM
Author: Sergei N. Magonov
Publisher: John Wiley & Sons
Total Pages: 335
Release: 2008-09-26
Genre: Technology & Engineering
ISBN: 3527615105

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Proceedings of the 8th International Conference on Advanced Intelligent Systems and Informatics 2022

Proceedings of the 8th International Conference on Advanced Intelligent Systems and Informatics 2022
Author: Aboul Ella Hassanien
Publisher: Springer Nature
Total Pages: 844
Release: 2022-11-17
Genre: Technology & Engineering
ISBN: 3031206010

This proceedings book constitutes the refereed proceedings of the 8th International Conference on Advanced Intelligent Systems and Informatics (AISI 2021), which took place in Cairo, Egypt, during November 20–22, 2022, and is an international interdisciplinary conference that presents a spectrum of scientific research on all aspects of informatics and intelligent systems, technologies, and applications.

Image Analysis and Evaluation of Cylinder Bore Surfaces in Micrographs

Image Analysis and Evaluation of Cylinder Bore Surfaces in Micrographs
Author: Wang, Limeng
Publisher: KIT Scientific Publishing
Total Pages: 134
Release: 2014-08-27
Genre: Technology & Engineering
ISBN: 3731502399

This work presents two image-based inspection approaches for the quality evaluation of cylinder bore surfaces. In the first algorithm, metal folds on plateau-honed surfaces are inspected with scanning electron microscopy. An edge-aware structure tensor is proposed for feature extraction and localization of surface defects. The second algorithm uses a morphgraphical method for detecting graphite grains in optical micrographs. Based on the inspection results, quality parameters are proposed.

Proceedings of the 2012 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

Proceedings of the 2012 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory
Author: Jürgen Beyerer
Publisher: KIT Scientific Publishing
Total Pages: 160
Release: 2014-05-14
Genre: Computers
ISBN: 3866449887

This book is a collection of 11 review technical reports summarizing the presentations at the 2012 Joint Workshop of Fraunhofer IOSB and Vision and Fusion Laboratory at KIT Karlsruhe, made by the students of the both institutions. The topics include image processing, visual inspection, pattern recognition and classification, human-machine interaction, world modeling, and optical signal processing.