Ieee Std 1801 2013 Revision Of Ieee Std 1801 2009
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Author | : Progyna Khondkar |
Publisher | : Springer |
Total Pages | : 165 |
Release | : 2017-10-05 |
Genre | : Technology & Engineering |
ISBN | : 3319666193 |
Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation project. This book is a first approach to establishing a comprehensive PA knowledge base. LP design, PA verification, and Unified Power Format (UPF) or IEEE-1801 power format standards are no longer special features. These technologies and methodologies are now part of industry-standard design, verification, and implementation flows (DVIF). Almost every chip design today incorporates some kind of low power technique either through power management on chip, by dividing the design into different voltage areas and controlling the voltages, through PA dynamic and PA static verification, or their combination. The entire LP design and PA verification process involves thousands of techniques, tools, and methodologies, employed from the r egister transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of design-verification complexity and more intelligent ways of handling that complexity by engineers, researchers, and corporate engineering policy makers.
Author | : Rakesh Chadha |
Publisher | : Springer Science & Business Media |
Total Pages | : 226 |
Release | : 2012-12-05 |
Genre | : Technology & Engineering |
ISBN | : 1461442710 |
This book provides an invaluable primer on the techniques utilized in the design of low power digital semiconductor devices. Readers will benefit from the hands-on approach which starts form the ground-up, explaining with basic examples what power is, how it is measured and how it impacts on the design process of application-specific integrated circuits (ASICs). The authors use both the Unified Power Format (UPF) and Common Power Format (CPF) to describe in detail the power intent for an ASIC and then guide readers through a variety of architectural and implementation techniques that will help meet the power intent. From analyzing system power consumption, to techniques that can be employed in a low power design, to a detailed description of two alternate standards for capturing the power directives at various phases of the design, this book is filled with information that will give ASIC designers a competitive edge in low-power design.
Author | : Daniel Große |
Publisher | : Springer |
Total Pages | : 134 |
Release | : 2018-12-19 |
Genre | : Technology & Engineering |
ISBN | : 3030022153 |
This book brings together a selection of the best papers from the twentiethedition of the Forum on specification and Design Languages Conference (FDL), which took place on September 18-20, 2017, in Verona, Italy. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems. Covers modeling and verification methodologies targeting digital and analog systems; Addresses firmware development and validation; Targets both functional and non-functional properties; Includes descriptions of methods for reliable system design.
Author | : Luciano Lavagno |
Publisher | : CRC Press |
Total Pages | : 773 |
Release | : 2017-12-19 |
Genre | : Technology & Engineering |
ISBN | : 1351830996 |
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author | : José L. Ayala |
Publisher | : Springer |
Total Pages | : 266 |
Release | : 2013-01-03 |
Genre | : Computers |
ISBN | : 3642361579 |
This book constitutes the refereed proceedings of the 22nd International Conference on Integrated Circuit and System Design, PATMOS 2012, held in Newcastle, UK Spain, in September 2012. The 25 revised full papers presented were carefully reviewed and selected from numerous submissions. The paper feature emerging challenges in methodologies and tools for the design of upcoming generations of integrated circuits and systems, including reconfigurable hardware such as FPGAs. The technical program focus on timing, performance and power consumption as well as architectural aspects with particular emphasis on modeling, design, characterization, analysis and optimization.
Author | : Raghunath Nambiar |
Publisher | : Springer |
Total Pages | : 155 |
Release | : 2014-01-31 |
Genre | : Computers |
ISBN | : 3319049364 |
This book constitutes the refereed post-proceedings of the 5th TPC Technology Conference, TPCTC 2013, held in Trento, Italy, in August 2013. It contains 7 selected peer-reviewed papers, a report from the TPC Public Relations Committee and one invited paper. The papers present novel ideas and methodologies in performance evaluation, measurement and characterization.
Author | : A. Roychoudhury |
Publisher | : IOS Press |
Total Pages | : 172 |
Release | : 2017-02-24 |
Genre | : Computers |
ISBN | : 1614997446 |
With our ever-increasing reliance on computer technology in every field of modern life, the need for continuously evolving and improving cyber security remains a constant imperative. This book presents the 3 keynote speeches and 10 papers delivered at the 2nd Singapore Cyber Security R&D Conference (SG-CRC 2017), held in Singapore, on 21-22 February 2017. SG-CRC 2017 focuses on the latest research into the techniques and methodologies of cyber security. The goal is to construct systems which are resistant to cyber-attack, enabling the construction of safe execution environments and improving the security of both hardware and software by means of mathematical tools and engineering approaches for the design, verification and monitoring of cyber-physical systems. Covering subjects which range from messaging in the public cloud and the use of scholarly digital libraries as a platform for malware distribution, to low-dimensional bigram analysis for mobile data fragment classification, this book will be of interest to all those whose business it is to improve cyber security.
Author | : Marcin Grzegorzek |
Publisher | : Logos Verlag Berlin GmbH |
Total Pages | : 238 |
Release | : 2017 |
Genre | : Computers |
ISBN | : 3832546332 |
The rapid development in the area of sensor technology has been responsible for a number of societal phenomena like UGC (User Generated Content) or QS (Quantified Self). Machine learning algorithms benefit a lot from the availability of such huge volumes of digital data. For example, new technical solutions for challenges caused by the demographic change (ageing society) can be proposed in this way, especially in the context of healthcare systems in industrialised countries. The goal of this book is to present selected algorithms for Visual Scene Analysis (VSA, processing UGC) as well as for Human Data Interpretation (HDI, using data produced within the QS movement) and to expose a joint methodological basis between these two scientific directions. While VSA approaches have reached impressive robustness towards human-like interpretation of visual sensor data, HDI methods are still of limited semantic abstraction power. Using selected state-of-the-art examples, this book shows the maturity of approaches towards closing the semantic gap in both areas, VSA and HDI.
Author | : Mohuya Chakraborty |
Publisher | : Springer Nature |
Total Pages | : 261 |
Release | : 2019-11-29 |
Genre | : Technology & Engineering |
ISBN | : 9811503613 |
This book gathers the peer-reviewed proceedings of the International Ethical Hacking Conference, eHaCON 2019, the second international conference of its kind, which was held in Kolkata, India, in August 2019. Bringing together the most outstanding research papers presented at the conference, the book shares new findings on computer network attacks and defenses, commercial security solutions, and hands-on, real-world security lessons learned. The respective sections include network security, ethical hacking, cryptography, digital forensics, cloud security, information security, mobile communications security, and cyber security.
Author | : Qi Wang |
Publisher | : MDPI |
Total Pages | : 426 |
Release | : 2019-09-30 |
Genre | : Computers |
ISBN | : 3038976849 |
With the recent advances in remote sensing technologies for Earth observation, many different remote sensors are collecting data with distinctive properties. The obtained data are so large and complex that analyzing them manually becomes impractical or even impossible. Therefore, understanding remote sensing images effectively, in connection with physics, has been the primary concern of the remote sensing research community in recent years. For this purpose, machine learning is thought to be a promising technique because it can make the system learn to improve itself. With this distinctive characteristic, the algorithms will be more adaptive, automatic, and intelligent. This book introduces some of the most challenging issues of machine learning in the field of remote sensing, and the latest advanced technologies developed for different applications. It integrates with multi-source/multi-temporal/multi-scale data, and mainly focuses on learning to understand remote sensing images. Particularly, it presents many more effective techniques based on the popular concepts of deep learning and big data to reach new heights of data understanding. Through reporting recent advances in the machine learning approaches towards analyzing and understanding remote sensing images, this book can help readers become more familiar with knowledge frontier and foster an increased interest in this field.