IEEE/CPMT International Electronic Manufacturing Technology Symposium : [proceedings].
Author | : |
Publisher | : |
Total Pages | : 504 |
Release | : 1997 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
Download Ieee Cpmt Semi 29th International Electronics Manufacturing Technology Symposium full books in PDF, epub, and Kindle. Read online free Ieee Cpmt Semi 29th International Electronics Manufacturing Technology Symposium ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author | : |
Publisher | : |
Total Pages | : 504 |
Release | : 1997 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
Author | : |
Publisher | : |
Total Pages | : 370 |
Release | : 2004 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
Author | : YongAn Huang |
Publisher | : Springer |
Total Pages | : 297 |
Release | : 2019-04-23 |
Genre | : Technology & Engineering |
ISBN | : 981133627X |
This book systematically discusses the modeling and application of transfer manipulation for flexible electronics packaging, presenting multiple processes according to the geometric sizes of the chips and devices as well as the detailed modeling and computation steps for each process. It also illustrates the experimental design of the equipment to help readers easily learn how to use it. This book is a valuable resource for scholars and graduate students in the research field of microelectronics.
Author | : Preeti S Chauhan |
Publisher | : Springer Science & Business Media |
Total Pages | : 254 |
Release | : 2013-09-20 |
Genre | : Technology & Engineering |
ISBN | : 1461457610 |
This critical volume provides an in-depth presentation of copper wire bonding technologies, processes and equipment, along with the economic benefits and risks. Due to the increasing cost of materials used to make electronic components, the electronics industry has been rapidly moving from high cost gold to significantly lower cost copper as a wire bonding material. However, copper wire bonding has several process and reliability concerns due to its material properties. Copper Wire Bonding book lays out the challenges involved in replacing gold with copper as a wire bond material, and includes the bonding process changes—bond force, electric flame off, current and ultrasonic energy optimization, and bonding tools and equipment changes for first and second bond formation. In addition, the bond–pad metallurgies and the use of bare and palladium-coated copper wires on aluminum are presented, and gold, nickel and palladium surface finishes are discussed. The book also discusses best practices and recommendations on the bond process, bond–pad metallurgies, and appropriate reliability tests for copper wire-bonded electronic components. In summary, this book: Introduces copper wire bonding technologies Presents copper wire bonding processes Discusses copper wire bonding metallurgies Covers recent advancements in copper wire bonding including the bonding process, equipment changes, bond–pad materials and surface finishes Covers the reliability tests and concerns Covers the current implementation of copper wire bonding in the electronics industry Features 120 figures and tables Copper Wire Bonding is an essential reference for industry professionals seeking detailed information on all facets of copper wire bonding technology.
Author | : Electronic Device Failure Analysis Society |
Publisher | : ASM International |
Total Pages | : 524 |
Release | : 2006 |
Genre | : Technology & Engineering |
ISBN | : 1615030891 |
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 593 |
Release | : 2018-12-01 |
Genre | : Technology & Engineering |
ISBN | : 1627080996 |
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author | : Walt Trybula |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 536 |
Release | : 1995 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
Author | : C. Colinge |
Publisher | : The Electrochemical Society |
Total Pages | : 656 |
Release | : 2010-10 |
Genre | : Science |
ISBN | : 1566778239 |
Semiconductor wafer bonding continues to evolve as a crucial technology extending new integration schemes and disseminating new product architectures in such diverse areas as high quality silicon-on-insulator (SOI) materials for electronic applications, Si-Ge strained layers, Germanium-on-Insulator (GeOI), 3D device integration, Si on quartz or glass for thin film displays, compound semiconductor-on-Si heterostructures and Micro-Electro-Mechanical Systems.
Author | : Beth Keser |
Publisher | : John Wiley & Sons |
Total Pages | : 634 |
Release | : 2019-02-20 |
Genre | : Technology & Engineering |
ISBN | : 1119313988 |
Examines the advantages of Embedded and FO-WLP technologies, potential application spaces, package structures available in the industry, process flows, and material challenges Embedded and fan-out wafer level packaging (FO-WLP) technologies have been developed across the industry over the past 15 years and have been in high volume manufacturing for nearly a decade. This book covers the advances that have been made in this new packaging technology and discusses the many benefits it provides to the electronic packaging industry and supply chain. It provides a compact overview of the major types of technologies offered in this field, on what is available, how it is processed, what is driving its development, and the pros and cons. Filled with contributions from some of the field's leading experts,Advances in Embedded and Fan-Out Wafer Level Packaging Technologies begins with a look at the history of the technology. It then goes on to examine the biggest technology and marketing trends. Other sections are dedicated to chip-first FO-WLP, chip-last FO-WLP, embedded die packaging, materials challenges, equipment challenges, and resulting technology fusions. Discusses specific company standards and their development results Content relates to practice as well as to contemporary and future challenges in electronics system integration and packaging Advances in Embedded and Fan-Out Wafer Level Packaging Technologies will appeal to microelectronic packaging engineers, managers, and decision makers working in OEMs, IDMs, IFMs, OSATs, silicon foundries, materials suppliers, equipment suppliers, and CAD tool suppliers. It is also an excellent book for professors and graduate students working in microelectronic packaging research.
Author | : Don Millard |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 504 |
Release | : 1997 |
Genre | : Ball grid array technology |
ISBN | : |
The IEMT symposium provides a forum for sharing experiences and knowledge based on microelectronic research and development. This volume is the result of the 1997 symposium and topics include: flip chip and TAB, substrate, soldering process, manufacturing, and packaging technology.