High Resolution Focused Ion Beams: FIB and its Applications

High Resolution Focused Ion Beams: FIB and its Applications
Author: Jon Orloff
Publisher: Springer Science & Business Media
Total Pages: 328
Release: 2003
Genre: Science
ISBN: 9780306473500

In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.

High Resolution Focused Ion Beams: FIB and its Applications

High Resolution Focused Ion Beams: FIB and its Applications
Author: Jon Orloff
Publisher: Springer Science & Business Media
Total Pages: 304
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461507650

In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.

Introduction to Focused Ion Beams

Introduction to Focused Ion Beams
Author: Lucille A. Giannuzzi
Publisher: Springer Science & Business Media
Total Pages: 362
Release: 2006-05-18
Genre: Science
ISBN: 038723313X

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Biological Field Emission Scanning Electron Microscopy, 2 Volume Set

Biological Field Emission Scanning Electron Microscopy, 2 Volume Set
Author: Roland A. Fleck
Publisher: John Wiley & Sons
Total Pages: 741
Release: 2019-04-29
Genre: Science
ISBN: 1118654064

The go‐to resource for microscopists on biological applications of field emission gun scanning electron microscopy (FEGSEM) The evolution of scanning electron microscopy technologies and capability over the past few years has revolutionized the biological imaging capabilities of the microscope—giving it the capability to examine surface structures of cellular membranes to reveal the organization of individual proteins across a membrane bilayer and the arrangement of cell cytoskeleton at a nm scale. Most notable are their improvements for field emission scanning electron microscopy (FEGSEM), which when combined with cryo-preparation techniques, has provided insight into a wide range of biological questions including the functionality of bacteria and viruses. This full-colour, must-have book for microscopists traces the development of the biological field emission scanning electron microscopy (FEGSEM) and highlights its current value in biological research as well as its future worth. Biological Field Emission Scanning Electron Microscopy highlights the present capability of the technique and informs the wider biological science community of its application in basic biological research. Starting with the theory and history of FEGSEM, the book offers chapters covering: operation (strengths and weakness, sample selection, handling, limitations, and preparation); Commercial developments and principals from the major FEGSEM manufacturers (Thermo Scientific, JEOL, HITACHI, ZEISS, Tescan); technical developments essential to bioFEGSEM; cryobio FEGSEM; cryo-FIB; FEGSEM digital-tomography; array tomography; public health research; mammalian cells and tissues; digital challenges (image collection, storage, and automated data analysis); and more. Examines the creation of the biological field emission gun scanning electron microscopy (FEGSEM) and discusses its benefits to the biological research community and future value Provides insight into the design and development philosophy behind current instrument manufacturers Covers sample handling, applications, and key supporting techniques Focuses on the biological applications of field emission gun scanning electron microscopy (FEGSEM), covering both plant and animal research Presented in full colour An important part of the Wiley-Royal Microscopical Series, Biological Field Emission Scanning Electron Microscopy is an ideal general resource for experienced academic and industrial users of electron microscopy—specifically, those with a need to understand the application, limitations, and strengths of FEGSEM.

Modern Electron Microscopy in Physical and Life Sciences

Modern Electron Microscopy in Physical and Life Sciences
Author: Milos Janecek
Publisher: BoD – Books on Demand
Total Pages: 302
Release: 2016-02-18
Genre: Science
ISBN: 9535122525

This book brings a broad review of recent global developments in theory, instrumentation, and practical applications of electron microscopy. It was created by 13 contributions from experts in different fields of electron microscopy and technology from over 20 research institutes worldwide.

Ion Beam Applications

Ion Beam Applications
Author: Ishaq Ahmad
Publisher: BoD – Books on Demand
Total Pages: 190
Release: 2018-07-18
Genre: Science
ISBN: 178923414X

Ion beam of various energies is a standard research tool in many areas of science, from basic physics to diverse areas in space science and technology, device fabrications, materials science, environment science, and medical sciences. It is an advance and versatile tool to frequently discover applications across a broad range of disciplines and fields. Moreover, scientists are continuously improving the ion beam sources and accelerators to explore ion beam at the forefront of scientific endeavours. This book provides a glance view on MeV ion beam applications, focused ion beam generation and its applications as well as practical applications of ion implantation.

Focused Ion Beam Systems

Focused Ion Beam Systems
Author: Nan Yao
Publisher: Cambridge University Press
Total Pages: 496
Release: 2007-09-13
Genre: Technology & Engineering
ISBN: 1107320569

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

Comprehensive Nanoscience and Nanotechnology

Comprehensive Nanoscience and Nanotechnology
Author:
Publisher: Academic Press
Total Pages: 1881
Release: 2019-01-02
Genre: Technology & Engineering
ISBN: 012812296X

Comprehensive Nanoscience and Technology, Second Edition, Five Volume Set allows researchers to navigate a very diverse, interdisciplinary and rapidly-changing field with up-to-date, comprehensive and authoritative coverage of every aspect of modern nanoscience and nanotechnology. Presents new chapters on the latest developments in the field Covers topics not discussed to this degree of detail in other works, such as biological devices and applications of nanotechnology Compiled and written by top international authorities in the field

Nanoscopic Approaches in Earth and Planetary Sciences

Nanoscopic Approaches in Earth and Planetary Sciences
Author: G. Jordan
Publisher: The Mineralogical Society of Great Britain and Ireland
Total Pages: 395
Release: 2010-08-01
Genre: Science
ISBN: 0903056259

The properties of matter at extreme length scales can differ markedly from those at length scales accessible to human observation. Nanogeoscience is described here: analytical techniques ranging from atomic force microscopy, nanoscale SIMS, TEM and EELS, to recent developments in nano-scale resolution in synchrotron radiation.

Helium Ion Microscopy

Helium Ion Microscopy
Author: Gregor Hlawacek
Publisher: Springer
Total Pages: 0
Release: 2016-10-12
Genre: Science
ISBN: 9783319419886

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.