High Precision X-Ray Measurements

High Precision X-Ray Measurements
Author: Alessandro Scordo
Publisher: MDPI
Total Pages: 144
Release: 2019-08-26
Genre: Science
ISBN: 3039213172

Since their discovery in 1895, the detection of X-rays has had a strong impact on and various applications in several fields of science and human life. Impressive efforts have been made to develop new types of detectors and new techniques, aiming to obtain higher precision both in terms of energy and position. Depending on the applications, solid state detectors, microcalorimeters, and various types of spectrometers currently serve as the best options for spectroscopic and imaging detectors. Recent advancements in micron and meV precision have opened the door for groundbreaking applications in fundamental physics, medical science, astrophysics, cultural heritage, and several other fields. The aim of this Special Issue is to compile an overview, from different communities and research fields, of the most recent developments in X-ray detection and their possible impacts in various sectors, such as in exotic atom measurements, quantum physics studies, XRF, XES, EXAFS, plasma emission spectroscopy, monochromators, synchrotron radiation, telescopes, and space engineering. All the papers included in this Special Issue contribute to emphasizing the importance of X-ray detection in a very broad range of physics topics; most of these topics are covered by the published works, and several others are mentioned in the paper references, providing an interesting and very useful synopsis, from a variety of different communities and research fields, of the most recent developments in X-ray detection and their impact in fundamental research and societal applications.

High-Resolution XAS/XES

High-Resolution XAS/XES
Author: Jacinto Sa
Publisher: CRC Press
Total Pages: 252
Release: 2014-07-14
Genre: Technology & Engineering
ISBN: 1466592982

Photon-in-photon-out core level spectroscopy is an emerging approach to characterize the electronic structure of catalysts and enzymes, and it is either installed or planned for intense synchrotron beam lines and X-ray free electron lasers. This type of spectroscopy requires high-energy resolution spectroscopy not only for the incoming X-ray beam but also, in most applications, for the detection of the outgoing photons. Thus, the use of high-resolution X-ray crystal spectrometers whose resolving power ΔE/E is typically about 10–4, is mandatory. High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts covers the latest developments in X-ray light sources, detectors, crystal spectrometers, and photon-in-photon-out core level spectroscopy techniques. It also addresses photon-in-photon-out core level spectroscopy applications for the study of catalytic systems, highlighting hard X-ray measurements primarily due to probe high penetration, enabling in situ studies. This first-of-its-kind book: Discusses high-resolution X-ray emission spectroscopy (XES) and X-ray absorption spectroscopy (XAS) in terms of time-resolved and surface enhancement Supplies an understanding of catalytic reactivity essential for capitalizing on core level X-ray spectroscopy at fourth-generation light sources (XFELs) Describes all spectrometers developed to perform core level X-ray spectroscopy, considering the advantages and disadvantages of each Details methods to elucidate aspects of catalysts under working conditions, such as active sites and molecule adsorption Introduces theoretical calculations of spectra and explores biological as well as heterogeneous catalysts Complete with guidelines and warnings for the use of this type of spectroscopy, High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts provides a comprehensive overview of the current state of this exciting field.

International Tables for Crystallography,Volume C

International Tables for Crystallography,Volume C
Author: E. Prince
Publisher: Springer Science & Business Media
Total Pages: 1033
Release: 2004-01-31
Genre: Science
ISBN: 1402019009

International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). The purpose of Volume C is to provide the mathematical, physical and chemical information needed for experimental studies in structural crystallography. The volume covers all aspects of experimental techniques, using all three principal radiation types, from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. As such, it is an essential source of information for all workers using crystallographic techniques in physics, chemistry, metallurgy, earth sciences and molecular biology.