Growth, Evolution and Properties of Surfaces, Thin Films, and Self Organized Structure: Volume 648

Growth, Evolution and Properties of Surfaces, Thin Films, and Self Organized Structure: Volume 648
Author: Steven C. Moss
Publisher:
Total Pages: 666
Release: 2001-09-20
Genre: Science
ISBN:

A significant portion of these papers from a winter 2000 symposium examine materials and devices at the nano-scale, with work on self- organized structures as well as nano-patterned thin-film structures. Materials research in three-, two-, one-, and zero-dimensional objects is addressed. Other major themes include pattern formation on surfaces, magnetism in films, thin film nucleation and alloy formation, and diffusion and morphological evolution of surfaces and thin films. Quantum dots and quantum size effects, metal/silicon and germanium/silicon epitaxy, metal on semiconductor and semiconductor thin films, and semiconductor epitaxy are also discussed. Annotation copyrighted by Book News Inc., Portland, OR.

Morphological and Compositional Evolution of Thin Films: Volume 749

Morphological and Compositional Evolution of Thin Films: Volume 749
Author: Michael J. Aziz
Publisher: Mrs Proceedings
Total Pages: 448
Release: 2003
Genre: Technology & Engineering
ISBN:

"The papers compiled in this volume were presented in Symposium W, 'Morphological and Compositional Evolution of Thin Films, ' held December 2-5 at the 2002 MRS Fall Meeting in Boston Massachusetts. They are organized in the order that they were presented."--P. xiii.

Dislocations and Deformation Mechanisms in Thin Films and Small Structures: Volume 673

Dislocations and Deformation Mechanisms in Thin Films and Small Structures: Volume 673
Author: Oliver Kraft
Publisher:
Total Pages: 250
Release: 2001-09-20
Genre: Technology & Engineering
ISBN:

The mechanical properties of small volumes of materials (such as thin films and patterned structures) can be very different from larger volumes, especially in the area of dislocation behavior. This text contains a selection of 31 papers from the April 2001 symposium devoted to new methods of dislocation modeling. Topics include mechanisms of plastic deformation in heteroepitaxial, multilayered, and polycrystalline thin films; as well as in 3D mesostructures such as epitaxial islands, semiconducting devices, and microcrystallites. The organizers of the symposium had the particular aim of stimulating exchange between experimental work, theoretical modeling, and numerical simulations. Annotation copyrighted by Book News Inc., Portland, OR.

Si Front-End Processing: Volume 669

Si Front-End Processing: Volume 669
Author: Erin C. Jones
Publisher:
Total Pages: 362
Release: 2001-12-14
Genre: Science
ISBN:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

II-IV Compound Semiconductor Photovoltaic Materials: Volume 668

II-IV Compound Semiconductor Photovoltaic Materials: Volume 668
Author: Robert Birkmire
Publisher:
Total Pages: 608
Release: 2001-10-15
Genre: Technology & Engineering
ISBN:

This book focuses on materials issues related to Cu(In,Ga)(Se,S)2 and CdTe-based polycrystalline thin-film photovoltaic solar cells and related oxides and chalcogenides. Phase equilibrium and thermochemical kinetic aspects of the absorber layer formation of CdTe and Cu(In,Ga)(Se,S)2 are emphasized and several papers on micro-analytical analysis report on detailed structural properties of thin films. The use of flexible plastic or metal foil substrates as an alternative to glass is addressed in terms of solar-cell performance and limitations imposed by the nature of the substrates. Properties of defects and interfaces in CdTe and CIGSS are highlighted using electrical, optical, and micro-analytical tools. While film properties are correlated to device physics, controversy still exists on the detailed operation of both CdTe and CIGSS devices. Topics include: materials and synthesis; thin films on alternate substrates; defects; growth and junction formation; surfaces and interfaces and film and device characterization.