Gettering and Defect Engineering in Semiconductor Technology XV

Gettering and Defect Engineering in Semiconductor Technology XV
Author: J.D. Murphy
Publisher: Trans Tech Publications Ltd
Total Pages: 513
Release: 2013-10-07
Genre: Technology & Engineering
ISBN: 3038262056

GADEST 2013 Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK

Gettering and Defect Engineering in Semiconductor Technology IV

Gettering and Defect Engineering in Semiconductor Technology IV
Author: M. Kittler
Publisher: Trans Tech Publications Ltd
Total Pages: 659
Release: 1991-01-01
Genre: Technology & Engineering
ISBN: 3035703019

Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991

Defect Engineering in Semiconductor Growth, Processing, and Device Technology

Defect Engineering in Semiconductor Growth, Processing, and Device Technology
Author: S. Ashok
Publisher:
Total Pages: 1176
Release: 1992
Genre: Technology & Engineering
ISBN:

Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR

Gettering and Defect Engineering in Semiconductor Technology XVI

Gettering and Defect Engineering in Semiconductor Technology XVI
Author: Peter Pichler
Publisher: Trans Tech Publications Ltd
Total Pages: 492
Release: 2015-10-23
Genre: Technology & Engineering
ISBN: 3035700834

Selected, peer reviewed papers from the GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany

High Purity Silicon VI

High Purity Silicon VI
Author: Electrochemical Society. Meeting
Publisher: The Electrochemical Society
Total Pages: 720
Release: 2000
Genre: Science
ISBN: 9781566772846

"... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.

Advanced Silicon & Semiconducting Silicon-Alloy Based Materials & Devices

Advanced Silicon & Semiconducting Silicon-Alloy Based Materials & Devices
Author: Jo Nijs
Publisher: CRC Press
Total Pages: 490
Release: 2021-05-30
Genre: Science
ISBN: 1000447790

One of the first books to cover advanced silicon-based technologies, Advanced Silicon and Semiconducting Silicon Alloy-Based Materials and Devices presents important directions for research into silicon, its alloy-based semiconducting devices, and its development in commercial applications. The first section deals with single/mono crystalline silicon, focusing on the effects of heavy doping; the structure and electronic properties of defects and their impact on devices; the MBE of silicon, silicon alloys, and metals; CVD techniques for silicon and silicon germanium; the material properties of silicon germanium strained layers; silicon germanium heterojunction bipolar applications; FETs, IR detectors, and resonant tunneling devices in silicon, silicon germanium, and d-doped silicon; and the fascinating properties of crystalline silicon carbide and its applications. The second section explores polycrystalline silicon. It examines large grain polysilicon substrates for solar cells; the properties, analysis, and modeling of polysilicon TFTs; the technology of polysilicon TFTs in LCD displays; and the use of polycrystalline silicon and its alloys in VLSI applications. With contributors from leading academic and industrial research centers, this book provides wide coverage of fabrication techniques, material properties, and device applications.

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
Author: Peter Pichler
Publisher: Springer Science & Business Media
Total Pages: 576
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3709105978

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.