Frontiers Of Characterization And Metrology For Nanoelectronics 2015
Download Frontiers Of Characterization And Metrology For Nanoelectronics 2015 full books in PDF, epub, and Kindle. Read online free Frontiers Of Characterization And Metrology For Nanoelectronics 2015 ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Frontiers of Characterization and Metrology for Nanoelectronics
Author | : David G. Seiler |
Publisher | : American Institute of Physics |
Total Pages | : 0 |
Release | : 2009-10-26 |
Genre | : Technology & Engineering |
ISBN | : 9780735407121 |
As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the introduction of new materials, innovative processing and assembly, and novel devices brings formidable metrology challenges. We have entered an era where nanotechnology is required to meet the demand for smaller, faster, cheaper, and more complex functional chips. Innovative metrology and characterization methods have become critical. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It comprises applications in nanoelectronic materials and devices, research and development, and manufacturing and diagnostics. Novel characterization methods for beyond CMOS and extreme CMOS devices are addressed, as well as electrical measurements, interconnects, patterning, microscopy, and modeling. The Editors believe that this book of collected papers from world-class leaders provides a basis and effective portrayal of the industry’s characterization and metrology needs and how they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductors into the nanoelectronic regime. It also provides a foundation for stimulating further advances in metrology and new ideas for research and development.
Metrology and Diagnostic Techniques for Nanoelectronics
Author | : Zhiyong Ma |
Publisher | : CRC Press |
Total Pages | : 1454 |
Release | : 2017-03-27 |
Genre | : Science |
ISBN | : 1351733958 |
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Frontiers of Characterization and Metrology for Nanoelectronics
Author | : David G. Seiler |
Publisher | : American Inst. of Physics |
Total Pages | : 0 |
Release | : 2007-09-26 |
Genre | : Science |
ISBN | : 9780735404410 |
This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry’s characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.
Metrology and Diagnostic Techniques for Nanoelectronics
Author | : Zhiyong Ma |
Publisher | : CRC Press |
Total Pages | : 843 |
Release | : 2017-03-27 |
Genre | : Science |
ISBN | : 135173394X |
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author | : ASM International |
Publisher | : ASM International |
Total Pages | : 666 |
Release | : 2017-12-01 |
Genre | : Technology & Engineering |
ISBN | : 1627081518 |
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Metrology and Physical Mechanisms in New Generation Ionic Devices
Author | : Umberto Celano |
Publisher | : Springer |
Total Pages | : 175 |
Release | : 2018-06-07 |
Genre | : Science |
ISBN | : 9783319819068 |
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Field Emission Scanning Electron Microscopy
Author | : Nicolas Brodusch |
Publisher | : Springer |
Total Pages | : 143 |
Release | : 2017-09-25 |
Genre | : Technology & Engineering |
ISBN | : 9811044333 |
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Metrology and Standardization for Nanotechnology
Author | : Elisabeth Mansfield |
Publisher | : John Wiley & Sons |
Total Pages | : 630 |
Release | : 2017-01-20 |
Genre | : Technology & Engineering |
ISBN | : 3527800050 |
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Metrology and Standardization for Nanotechnology
Author | : Elisabeth Mansfield |
Publisher | : |
Total Pages | : 595 |
Release | : 2017 |
Genre | : Nanotechnology |
ISBN | : 9783527712427 |