First And Second Order Charged Particle Optics
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| Author | : Jon Orloff |
| Publisher | : CRC Press |
| Total Pages | : 666 |
| Release | : 2017-12-19 |
| Genre | : Science |
| ISBN | : 1420045555 |
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
| Author | : Timothy R. Groves |
| Publisher | : CRC Press |
| Total Pages | : 369 |
| Release | : 2017-12-19 |
| Genre | : Science |
| ISBN | : 1482229951 |
Charged Particle Optics Theory: An Introduction identifies the most important concepts of charged particle optics theory, and derives each mathematically from the first principles of physics. Assuming an advanced undergraduate-level understanding of calculus, this book follows a logical progression, with each concept building upon the preceding one. Beginning with a non-mathematical survey of the optical nature of a charged particle beam, the text: Discusses both geometrical and wave optics, as well as the correspondence between them Describes the two-body scattering problem, which is essential to the interaction of a fast charged particle with matter Introduces electron emission as a practical consequence of quantum mechanics Addresses the Fourier transform and the linear second-order differential equation Includes problems to amplify and fill in the theoretical details, with solutions presented separately Charged Particle Optics Theory: An Introduction makes an ideal textbook as well as a convenient reference on the theoretical origins of the optics of charged particle beams. It is intended to prepare the reader to understand the large body of published research in this mature field, with the end result translated immediately to practical application.
| Author | : Anjam Khursheed |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 282 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 146155201X |
In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.
| Author | : Hermann Wollnik |
| Publisher | : Academic Press |
| Total Pages | : 319 |
| Release | : 2021-10-23 |
| Genre | : Science |
| ISBN | : 012821466X |
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
| Author | : Harald Rose |
| Publisher | : Springer |
| Total Pages | : 519 |
| Release | : 2013-02-02 |
| Genre | : Science |
| ISBN | : 3642321194 |
This second edition is an extended version of the first edition of Geometrical Charged-Particle Optics. The updated reference monograph is intended as a guide for researchers and graduate students who are seeking a comprehensive treatment of the design of instruments and beam-guiding systems of charged particles and their propagation in electromagnetic fields. Wave aspects are included in this edition for explaining electron holography, the Aharanov-Bohm effect and the resolution of electron microscopes limited by diffraction. Several methods for calculating the electromagnetic field are presented and procedures are outlined for calculating the properties of systems with arbitrarily curved axis. Detailed methods are presented for designing and optimizing special components such as aberration correctors, spectrometers, energy filters monochromators, ion traps, electron mirrors and cathode lenses. In particular, the optics of rotationally symmetric lenses, quadrupoles, and systems composed of these elements are discussed extensively. Beam properties such as emittance, brightness, transmissivity and the formation of caustics are outlined. Relativistic motion and spin precession of the electron are treated in a covariant way by introducing the Lorentz-invariant universal time and by extending Hamilton’s principle from three to four spatial dimensions where the laboratory time is considered as the fourth pseudo-spatial coordinate. Using this procedure and introducing the self action of the electron, its accompanying electromagnetic field and its radiation field are calculated for arbitrary motion. In addition, the Stern-Gerlach effect is revisited for atomic and free electrons.
| Author | : Peter W. Hawkes |
| Publisher | : Academic Press |
| Total Pages | : 767 |
| Release | : 2017-12-13 |
| Genre | : Science |
| ISBN | : 0128134054 |
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
| Author | : |
| Publisher | : |
| Total Pages | : 1002 |
| Release | : 1985 |
| Genre | : Aeronautics |
| ISBN | : |
| Author | : Christine Petit-jean-genaz |
| Publisher | : World Scientific |
| Total Pages | : 2968 |
| Release | : 1994-11-26 |
| Genre | : |
| ISBN | : 9814550272 |
These proceedings aim to provide a comprehensive overview of research, technology and applications in the field of accelerators. Contributions from the entire field of accelerators are presented, including low and high energy machines, and medical and industrial accelerators.
| Author | : |
| Publisher | : Academic Press |
| Total Pages | : 406 |
| Release | : 2009-07-15 |
| Genre | : Technology & Engineering |
| ISBN | : 0080912168 |
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
| Author | : |
| Publisher | : |
| Total Pages | : 194 |
| Release | : 1996 |
| Genre | : Electron optics |
| ISBN | : |
